Using Crystal Wedge to Measure Temperature Dependence of Quartz Wave Plates′ Phase Retardation

Canhua, 许灿华 Xu; Qifeng, 徐启峰 Xu; Nan, 谢楠 Xie

doi:10.3788/aos201434.0212004

Cited by 1 publication

(1 citation statement)

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“…However, the temperature drift of the wave plate cannot be ignored. For example, the temperature drift of the zero-order wave plate is 0.024 • / • C [12], and the amplitude error is about 2.93% at the operating temperature range of the OVT (i.e. −40 • C to 70 • C), which far exceeds the measurement limitation of 0.2 class accuracy.…”

Section: Introductionmentioning

confidence: 91%

AC zero crossing compensation for thermal stress linear birefringence in optical voltage transducer

Huang,

Xu,

et al. 2023

Meas. Sci. Technol.

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The optical voltage transducer (OVT) based on the Pockels effect has a perennial issue of the thermal stress linear birefringence in the electro-optic crystal being overlapped with the electro-optic phase delay, which is difficult to be eliminated and seriously affects the measurement accuracy and reliability. In this paper an AC zero crossing compensation method for thermal stress linear birefringence is proposed. It is based on that when the steady-state AC voltage crosses zero points the electric field is zero, and the electro-optic crystal does not have any electro-optic effect, so the electro-optic phase delay is zero. In this case, the output of the OVT is an additional phase delay caused by the thermal stress linear birefringence, which can be separated and compensated by the linear demodulation OVT and the AC zero crossing detection circuit. The experimental results show that in the temperature range of -40℃ to 70℃, the measurement accuracy of the OVT after thermal stress linear birefringence compensation is improved from 0.5 class to 0.2 class. This method is helpful for the practicality of the OVT.

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Section: Introductionmentioning

confidence: 91%