2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2020
DOI: 10.1109/dft50435.2020.9250842
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Validation Challenges in Recent Trends of Power Management in Microprocessors

N V Uma Reddy
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,
S.M. Menon
2
,
Prashant D. Joshi
3
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