J Mater Sci Lett
 1995
DOI: 10.1007/bf00456559
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Variation of secondary electron yield in the fractured surface of melt-textured growth YBCO superconductor with Y2BaCu05 grains under a scanning electron microscope in the temperature range 81?300 K

James C. L. Chow
1
,
P. C. W. Fung
2
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