Advances in Cryogenic Engineering 1998
DOI: 10.1007/978-1-4757-9047-4_178
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Various Film Boiling States in He II at Hydrostatic Pressures from Saturated Vapor Pressure to 1 ATM

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Cited by 10 publications
(2 citation statements)
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“…FFT analysis shows that the frequency of the later part of the pressure oscillation wave in the gure is about 160 Hz, as shown in Figure 10b, which is in good agreement with the frequency of the liquid He II column oscillation [17] for corresponding depth of immersion. The frequency of the later stage which is induced by liquid column oscillation is much larger than that of the early part.…”
Section: Boiling In Liquid Helium IIsupporting
confidence: 70%
“…FFT analysis shows that the frequency of the later part of the pressure oscillation wave in the gure is about 160 Hz, as shown in Figure 10b, which is in good agreement with the frequency of the liquid He II column oscillation [17] for corresponding depth of immersion. The frequency of the later stage which is induced by liquid column oscillation is much larger than that of the early part.…”
Section: Boiling In Liquid Helium IIsupporting
confidence: 70%
“….これらの膜沸騰 モードに関しては,熱伝達測定に関する実験データが多く 報告されている [5][6][7][8][9][10][11][12] .さらに,ノイジー及びサイレント膜 沸騰が発生する領域は,圧力,温度,熱流束に依存するこ とが分かっている 5,12) .可視化観測や圧力・温度変動の測 定により,これらの膜沸騰モードの熱流動状態の特徴を明 らかにする研究も行われている [13][14][15] . He II p 中のサブクール膜沸騰の研究については,熱伝達 測定に関する研究が多くなされている [16][17][18][19] .これらの研 究では,実験条件圧力が 101 kPa (1 atm) 17,18) ,もしくは λ 点圧力近傍の弱サブクール状態 19…”
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