2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) 2016
DOI: 10.1109/apeie.2016.7807076
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Verification “in silicon” active output rectifier controller IC in 250 nm BCD technology for high-efficiency power converters

Vladimir A. Ryzhkov
1
,
Andrey A. Antonov
2
,
Maksim S. Karpovich
3
et al.
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“In silicon” verification of Multi-Functional Control Integrated Circuits in 250 nm BCD technology for high-efficiency power converters

Antonov
1
,
Karpovich
2
,
Pichugin
3
et al. 2016
2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)
4
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0
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“In silicon” verification of Multi-Functional Control Integrated Circuits in 250 nm BCD technology for high-efficiency power converters

Antonov
1
,
Karpovich
2
,
Pichugin
3
et al. 2016
2016 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)
4
0
0
0
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Time domain and ZCS approximation in tristable digital buffer amplifiers engineering for power converters

Antonov
1
,
Karpovich
2
,
Pichugin
3
et al. 2017
2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)
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Dual 4-A High-Speed Low-Side Gate Driver IC for GaN and Si MOSFETs and IGBTs

Antonov
1
,
Karpovich
2
,
Vasilyev
3
2022
2022 IEEE 23rd International Conference of Young Professionals in Electron Devices and Materials (EDM)
2
0
0
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