2018 International Russian Automation Conference (RusAutoCon) 2018
DOI: 10.1109/rusautocon.2018.8501726
|View full text |Cite
|
Sign up to set email alerts
|

Virtual Testing of Electronic Systems Susceptibility by Electromagnetic Compatibility Requirements

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2019
2019
2022
2022

Publication Types

Select...
4
1
1

Relationship

0
6

Authors

Journals

citations
Cited by 10 publications
(1 citation statement)
references
References 4 publications
0
1
0
Order By: Relevance
“…This is caused by the widespread use of REE in various fields of technology. Another reason is EMC concerns all structural levels of the equipment: from microchips to onboard REE [11,12]. Special attention should be paid to the increase in the speed and packaging density of modern REE, which makes it extremely susceptible to the effects of both external and internal electromagnetic interference (EMI).…”
Section: Introductionmentioning
confidence: 99%
“…This is caused by the widespread use of REE in various fields of technology. Another reason is EMC concerns all structural levels of the equipment: from microchips to onboard REE [11,12]. Special attention should be paid to the increase in the speed and packaging density of modern REE, which makes it extremely susceptible to the effects of both external and internal electromagnetic interference (EMI).…”
Section: Introductionmentioning
confidence: 99%