Voltage to Current Correlation for CDM Testing

Zeitlhoefler, Lena; Lutz, Theresa; Zur Nieden, Friedrich; Esmark, Kai; Gaertner, Reinhold

doi:10.23919/eos/esd58195.2023.10287735

2023 45th Annual EOS/ESD Symposium (EOS/ESD) 2023

DOI: 10.23919/eos/esd58195.2023.10287735

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Voltage to Current Correlation for CDM Testing

Lena Zeitlhoefler,

Theresa Lutz,

Friedrich Zur Nieden

et al.

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2024

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Cited by 3 publications

References 11 publications

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Analysis, Testing and Comparison of Different Commercial ESD Detectors

Hameed,

Reithofer,

Fellner

et al. 2024

2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

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Analysis, Testing and Comparison of Different Commercial ESD Detectors

Hameed,

Reithofer,

Fellner

et al. 2024

2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

View full text Add to dashboard Cite

The Demand for a CDM Bare Die Testing Method

Zeitlhoefler,

Lutz,

Nieden

et al. 2024

2024 46th Annual EOS/ESD Symposium (EOS/ESD)

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In-situ ESD current sensing in a pick and place machine

Jirutková,

Wolf,

Gieser

2024

2024 46th Annual EOS/ESD Symposium (EOS/ESD)

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Voltage to Current Correlation for CDM Testing

Cited by 3 publications

References 11 publications

Analysis, Testing and Comparison of Different Commercial ESD Detectors

Analysis, Testing and Comparison of Different Commercial ESD Detectors

The Demand for a CDM Bare Die Testing Method

In-situ ESD current sensing in a pick and place machine

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