2005
DOI: 10.1063/1.1851392
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Write performance of shielded pole heads on media with thin soft underlayers

Abstract: Nonlinear finite element calculations show that the soft underlayer thickness in perpendicular media can be greatly reduced without significant loss of effective switching field strength by using a shielded pole writer in place of the more conventional monopole geometry. In addition, use of a thin soft underlayer (SUL) with a shielded pole writer with a thin SUL results in a higher gradient and a narrower magnetic write width. These results have been qualitatively confirmed experimentally.

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Cited by 7 publications
(4 citation statements)
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“…As rule of thumb, the gap g should be about the same has the head-to-keeper spacing h KS [43]. Practical implementations and theoretical aspects of shielded heads have been discussed in [40,43,[45][46][47][48][49]. Since some of the flux generated by the main pole is sucked away by the shield, the SUL can be made somewhat thinner [48].…”
Section: Writing With Shielded Heads and Ring Headsmentioning
confidence: 99%
“…As rule of thumb, the gap g should be about the same has the head-to-keeper spacing h KS [43]. Practical implementations and theoretical aspects of shielded heads have been discussed in [40,43,[45][46][47][48][49]. Since some of the flux generated by the main pole is sucked away by the shield, the SUL can be made somewhat thinner [48].…”
Section: Writing With Shielded Heads and Ring Headsmentioning
confidence: 99%
“…Since the magnetic flux from the write pole return to the shielded pole, which is less than 100 nm apart, the writing field is essentially tilted [3]. And since most of the magnetic flux return directly to the shielded return pole, the field duplication effect of the SUL is greatly reduced [4]. The thickness of the SUL can be reduced to below 50 nm.…”
Section: Introductionmentioning
confidence: 99%
“…However, H/S stacked media showed experimental results of positive nucleation field (H n ) [9,12] and relatively low negative H n [10] compared to CL media. A more negative value of H n is essential for overcoming adjacent track erasure (ATE) and return field-induced partial erasure (RFPE) [13,14].…”
Section: Introductionmentioning
confidence: 99%