X‐Ray Absorption and X‐Ray Emission Spectroscopy 2016
DOI: 10.1002/9781118844243.ch13
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X‐Ray Absorption and Emission Spectroscopy for Catalysis

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Cited by 32 publications
(38 citation statements)
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“…Extended X-ray adsorption fine structure (EXAFS) data were measured at the Pd K-edge (24.35 keV) in transmission mode on pelletized samples at the SuperXAS beamline of the Swiss Light Source (SLS, Paul Scherrer Institut). The Fourier transformation of the k 2 -weighted EXAFS functions was performed the range 3-12 Å −1 [20]. Data reduction was performed using the Athena software package [21].…”
Section: Catalyst Characterizationmentioning
confidence: 99%
“…Extended X-ray adsorption fine structure (EXAFS) data were measured at the Pd K-edge (24.35 keV) in transmission mode on pelletized samples at the SuperXAS beamline of the Swiss Light Source (SLS, Paul Scherrer Institut). The Fourier transformation of the k 2 -weighted EXAFS functions was performed the range 3-12 Å −1 [20]. Data reduction was performed using the Athena software package [21].…”
Section: Catalyst Characterizationmentioning
confidence: 99%
“…Synchrotron-based X-ray absorption spectroscopy (XAS) has developed to be the method of choice to determine redox-type reaction mechanisms by studying the electronic and local atomic structures of the metal of interest within the heterogeneous catalysts under operating conditions 23,24 . However, there are no reported XAS studies focused on deciphering the active sites in heterogeneous or homogeneous Wacker oxidation.…”
mentioning
confidence: 99%
“…Therefore, we used transient XAS, with which the dynamic speciation of palladium and copper can be determined. When the kinetically relevant step is directly affected by disturbing the system, be it by changing the pressure, concentration or temperature, the active site yields a quick response while the spectator species would elicit a slower response 24 .…”
mentioning
confidence: 99%
“…Ранее было обнаружено [10], что температур-ная обработка электрокатализаторов PtCu/C при 300 • C приводит к структурным изменениям, проявляемым в сдвиге дифракционных максимумов на порошковых рентгеновских дифрактограммах. С целью выяснения ха-рактера таких изменений с изменениями в архитектуре биметаллических наночастиц PtCu в результате терми-ческой обработки в настоящей работе выполнены струк-турные исследования электрокатализаторов PtCu/C, полученных в результате температурной обработки при T = 350 • C. Структурные исследования выполнены с использованием 1) PtL 3 -и CuK-спектров рентгеновского поглощения в протяженной энергетической области за краем поглощения (extended X-ray absorption fine structure -EXAFS) [11][12][13][14]; 2) просвечивающей электронной микроскопии (transmission electron microscopy -ТЕМ); 3) порошковой рентгеновской дифракции (X-ray diffraction -XRD). Еще одной целью работы является установление чувствительности метода EXAFS-спектроскопии к изменениям архитектуры мно-жества биметаллических наночастиц в результате прове-денного термического воздействия.…”
Section: Introductionunclassified