X-ray diffraction line broadening from thermally deposited gold films

Cheary, R.W.; Dooryhée, E.; Lynch, P.A.; Armstrong, N.; Dligatch, Svetlana

doi:10.1107/s0021889800009936

Cited by 38 publications

(26 citation statements)

References 22 publications

(13 reference statements)

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“…Nanocrystalline gold films of thickness ranging from 30 to 190 nm were grown by thermal deposition on glass substrates [45]. The columnar, nanocrystalline grain structure was analysed by atomic force microscopy, TEM and XLPA.…”

Section: The Microstructure Of Nanocrystalline Materials Produced By mentioning

confidence: 99%

“…Anisotropic crystallite shape are a delicate phenomenon [26] which has been treated by special elegance in the case of ZnO nanoparticles [23]. Finally, anisotropic strain broadening is a general feature of powder patterns [43][44][45][46][47][48][49][50][51][52][53][54][55][56], which is generally related to dislocations and the elastic properties of crystals. In the present work a few typical examples are reviewed where the microstructure of nanocrystalline materials has been characterized by the method of XLPA.…”

Section: Introductionmentioning

confidence: 99%

“…The complex microstructure was solved in terms of dislocation densitites and Burgers vector determination. The modified Williamson-Hall plot was used to unfold the qualitative features of strain anisotropy in terms of dislocation occupation [45]. The analysis of the magnitude and anisotropy of the dislocation-induced line broadening with hkl indicated that the dislocations have had a mixed screw/edge character with a tendency to form primarily on those slip planes running parallel to the substrate with densities of about 10 15 to 10 16 m À2 .…”

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confidence: 99%

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Nanocrystalline materials studied by powder diffraction line profile analysis

Ungár¹,

Gubicza²

2007

Zeitschrift Für Kristallographie - Crystalline Materials

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Abstract. X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain. It is widely applied for nanocrystalline materials, especially since other methods, in particular electron microscopy is, on the one hand tedious and time consuming, on the other hand, due to the often metastable states of nanomaterials it might change their microstructures. It is attempted to overview the applications of microstructure characterization by powder diffraction on nanocrystalline metals, alloys, ceramics and carbon base materials. Whenever opportunity is given, the data provided by the X-ray method are compared and discussed together with results of electron microscopy. Since the topic is vast we do not try to cover the entire field.

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Section: The Microstructure Of Nanocrystalline Materials Produced By mentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

mentioning

confidence: 99%

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Nanocrystalline materials studied by powder diffraction line profile analysis

Ungár¹,

Gubicza²

2007

Zeitschrift Für Kristallographie - Crystalline Materials

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“…In principle, therefore, the technique should be adaptable to any powder diffractometer and fit profiles of widely differing shapes, such as those in Fig. 2, by simply modifying the physical parameters of the diffractometer used to describe the profile.Although most applications of FPPF have focussed on the conventional diffractometer it has also been utilised for analysing neutron diffraction data [9] and synchrotron data [10,11]. In the TOPAS implementation of FPPF there are a wide variety of possible aberration functions available within the package and these can put together to suit a particular diffractometer design and in terms of parameters that are relevant to the instrument.…”

mentioning

confidence: 99%

Fundamental parameters line profile fitting in laboratory diffractometers

Cheary¹,

Coelho²,

Cline³

2004

J. Res. Natl. Inst. Stand. Technol.

612

430

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The fundamental parameters approach to line profile fitting uses physically based models to generate the line profile shapes. The instrument profile shape K(2θ) is first synthesised by convoluting together the geometrical instrument function J(2θ) with the wavelength profile W(2θ) at the Bragg angle 2θ B of the peak, K(2θ) = ∫W(2θ -2ϕ)J(2ϕ)d2ϕ = W(2θ) ⊗ J(2θ) (1) where the function J(2θ) itself is a convolution of the various instrument aberration functions associated with the diffractometer, ie., J(2θ) = J 1 (2θ) ⊗ J 2 (2θ) ⊗…⊗ J i (2θ)…..⊗ J N (2θ).Diffraction broadening is incorporated into the profile function I(2θ) by convoluting the broadening function B(2θ) into the instrument profile function as shown I(2θ) = K(2θ) ⊗ B(2θ).This technique of profile synthesis was first introduced 50 years ago by Alexander [1], but has only been implemented as a standard fitting procedure during the last ten years [2,3,4]. More recently, freeware and commer- FPPF has been used to synthesise and fit data from both parallel beam and divergent beam diffractometers. The refined parameters are determined by the diffractometer configuration. In a divergent beam diffractometer these include the angular aperture of the divergence slit, the width and axial length of the receiving slit, the angular apertures of the axial Soller slits, the length and projected width of the x-ray source, the absorption coefficient and axial length of the sample. In a parallel beam system the principal parameters are the angular aperture of the equatorial analyser/Soller slits and the angular apertures of the axial Soller slits. The presence of a monochromator in the beam path is normally accommodated by modifying the wavelength spectrum and/or by changing one or more of the axial divergence parameters. Flat analyser crystals have been incorporated into FPPF as a Lorentzian shaped angular acceptance function.One of the intrinsic benefits of the fundamental parameters approach is its adaptability to any laboratory diffractometer. Good fits can normally be obtained over the whole 2θ range without refinement using the known properties of the diffractometer, such as the slit sizes and diffractometer radius, and the emission profile. Fine tuning is sometimes necessary to accommodate a monochromator or to compensate for the fact that certain aberrations are not completely independent [8]. Under these conditions some of the instrument parameters need to be refined, but the refined values normally are within ±10 % of the actual values. Correlation between refined instrument parameters can occur when fitting to data over a restricted 2θ range. Such correlation occurs between the axial divergence parameters and absorption as both of these aberrations can produce similar forms of asymmetric profiles between 2θ = 50° and 100° in diverging beam diffractometers. Correlation is minimised by using data with a large 2θ range so that the unique angular dependence of individual aberrations becomes evident. When a set of instrument profiles cannot be fitted by FPPF, this...

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“…Strain anisotropy proved to be a powerful feature in XLPA, especially for determining Burgers-vector populations or active slip systems [37][38][39][40][41][42][43][44][45][46][47][48][49].…”

Section: Strain Anisotropymentioning

confidence: 99%

Microstructure of Bulk Nanomaterials Determined by X‐Ray Line‐Profile Analysis

Ungár¹,

Schafler²,

Gubicza

2009

Bulk Nanostructured Materials

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The physical properties of structural materials are determined by their microstructure. The microstructure can be investigated either by direct methods, especially transmission or scanning electron microscopy (TEM or SEM), or by the indirect methods, like X-ray line-profile analysis (XLPA), differential scanning calorimetry (DSC), residual electrical resistivity (RER) or the different methods of mechanical testing. All these methods, irrespective of whether direct or indirect, reflect different aspects of the different microstructure features. The more methods that are used, the more comprehensive will be the microstructure characterization. In the present work the method of XLPA is summarized and discussed in comparison with other methods listed here. It is attempted to reveal how XLPA can contribute to a more complete characterization of the microstructure of bulk nanomaterials, especially when combined with other methods. General Concept and the Basic Ideas of X-ray Line-profile AnalysisWithin the framework of the kinematical scattering theory, the ideal diffraction pattern of a polycrystalline specimen consists of narrow, symmetrical, deltafunction-like peaks at the positions of the exact Bragg angles according to the well-defined unit cell of the crystal

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X-ray diffraction line broadening from thermally deposited gold films

Cited by 38 publications

References 22 publications

Nanocrystalline materials studied by powder diffraction line profile analysis

Nanocrystalline materials studied by powder diffraction line profile analysis

Fundamental parameters line profile fitting in laboratory diffractometers

Microstructure of Bulk Nanomaterials Determined by X‐Ray Line‐Profile Analysis

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