Abstract:Polarimetry is a highly sensitive method to quantify changes of the polarization state of light when passing through matter and is therefore widely applied in material science. The progress of synchrotron and X-ray free electron laser (XFEL) sources has led to significant developments of X-ray polarizers, opening perspectives for new applications of polarimetry to study source and beamline parameters as well as sample characteristics. X-ray polarimetry has shown to date a polarization purity of less than
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