X-Ray Raman Scattering Experiment. I

Suzuki, Tadasu

doi:10.1143/jpsj.22.1139

Cited by 109 publications

(49 citation statements)

References 8 publications

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“…Comparison of σ abs (ω)/ω and S(q, ω) for q = 0.24 a.u. clearly shows the well known and experimentally verified [4] fact that inelastic scattering results at low momentum transfer can be used to obtain the same EX-AFS information as in XAS. Since we are interested in discussing the general trends of the momentum transfer dependence of S i (q, ω) in the extended energy range we have not included the Al L 2,3 -edge (edge located at about 80 eV) to this theoretical demonstration.…”

Section: Figsupporting

confidence: 68%

Inelastic scattering from core electrons: A multiple scattering approach

2005

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The real-space multiple-scattering (RSMS) approach is applied to model non-resonant inelastic scattering from deep core electron levels over a broad energy spectrum. This approach is applicable to aperiodic or periodic systems alike and incorporates ab initio, self-consistent electronic structure and final state effects. The approach generalizes to finite momentum transfer a method used extensively to model x-ray absorption spectra (XAS), and includes both near edge spectra and extended fine structure. The calculations can be used to analyze experimental results of inelastic scattering from core-electrons using either x-ray photons (NRIXS) or electrons (EELS). In the low momentum transfer region (the dipole limit), these inelastic loss spectra are proportional to those from XAS. Thus their analysis can provide similar information about the electronic and structural properties of a system. Results for finite momentum transfer yield additional information concerning monopole, quadrupole, and higher couplings. Our results are compared both with experiment and with other theoretical calculations.

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Section: Figsupporting

confidence: 68%

Inelastic scattering from core electrons: A multiple scattering approach

2005

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“…The spectrometer is tuned to a Bragg angle as close as possible to 90 o to guarantee the best energy resolution, and the incident energy E is varied. Inelastically scattered photons can transfer their energy loss E-E 0 to a core level electron which is then promoted to an empty state [37][38][39][40][41][42]. Thus, in principle, Raman scattering gives the possibility to do soft X-ray absorption spectroscopy using hard X-rays.…”

Section: Applicationsmentioning

confidence: 99%

High-resolution large-acceptance analyzer for x-ray fluorescence and Raman spectroscopy

Bergmann

Cramer

1998

SPIE Proceedings

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A newly designed multi-crystal X-ray spectrometer and its applications in the fields of X-ray fluorescence and X-ray Raman spectroscopy are described. The instrument is based on 8 spherically curved Si crystals, each with a 3.5 inch diameter form bent to a radius of 86 cm. The crystals are individually aligned in the Rowland geometry capturing a total solid angle of 0.07 sr. The array is arranged in a way that energy scans can be performed by moving the whole instrument, rather than scanning each crystal by itself. At angles close to back scattering the energy resolution is between 0.3 and 1 eV depending on the beam dimensions at the sample. The instrument is mainly designed for X-ray absorption and fluorescence spectroscopy of transition metals in dilute systems such as metalloproteins. First results of the Mn Kβ (3p -> 1s) emission in photosystem II are shown. An independent application of the instrument is the technique of X-ray Raman spectroscopy which can address problems similar to those in traditional soft X-ray absorption spectroscopies, and initial results are presented.

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“…The inelastic X-ray scattering technique (IXS), also called X-ray Raman scattering (XRS), is based on a photon-in photon-out scattering process of hard X-rays from low Z elements [4,[15][16][17][18]. Through this scattering process, the core electron is excited to an unoccupied electronic state just above the Fermi level, and the energy loss shifts the scattered photon energy to lower values.…”

Section: Introductionmentioning

confidence: 99%

A Dispersive Inelastic X-ray Scattering Spectrometer for Use at X-ray Free Electron Lasers

et al. 2017

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Abstract:We report on the application of a short working distance von Hamos geometry spectrometer to measure the inelastic X-ray scattering (IXS) signals from solids and liquids. In contrast to typical IXS instruments where the spectrometer geometry is fixed and the incoming beam energy is scanned, the von Hamos geometry allows measurements to be made using a fixed optical arrangement with no moving parts. Thanks to the shot-to-shot capability of the spectrometer setup, we anticipate its application for the IXS technique at X-ray free electron lasers (XFELs). We discuss the capability of the spectrometer setup for IXS studies in terms of efficiency and required total incident photon flux for a given signal-to-noise ratio. The ultimate energy resolution of the spectrometer, which is a key parameter for IXS studies, was measured to the level of 150 meV at short crystal radius thanks to the application of segmented crystals for X-ray diffraction. The short working distance is a key parameter for spectrometer efficiency that is necessary to measure weak IXS signals.

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X-Ray Raman Scattering Experiment. I

Cited by 109 publications

References 8 publications

Inelastic scattering from core electrons: A multiple scattering approach

Inelastic scattering from core electrons: A multiple scattering approach

High-resolution large-acceptance analyzer for x-ray fluorescence and Raman spectroscopy

A Dispersive Inelastic X-ray Scattering Spectrometer for Use at X-ray Free Electron Lasers

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