XPS study of Pd/Co multilayers: identification of Pd and Co interface bonding states by pattern recognition methods

UHV-EC Characterization of Ultrathin Films Electrodeposited on Well-Defined Noble Metals. II: Co on Pd(111)

“…Subtle differences in physico-chemical properties may also arise from the extent of atomic mingling at the interface. Impacts coming from bombarding species during sputtering are shown to favor interfacial alloying; evidences are provided by XPS shape-pattern recognition [12] and polarized extended Xray absorption fine structure [13]. Enhancement of MO properties, such as remanent magnetization and PMA, has been observed for sputtered surfaces [14].…”

X‐Ray Photoelectron Spectroscopy in Analysis of SurfacesUpdate based on the original article by Steffen Oswald,Encyclopedia of Analytical Chemistry, © 2000, John Wiley & Sons, Ltd.

“…Marinova et al (93) showed an example of an Al−Ni−Al on SiC contact system where both the elemental changes and peak shape changes connected with phase formation were explained on the basis of depth-profiling measurements. Working with Pd−Co superlattices, Lesiak et al (94) determined the interface phases using a pattern recognition method.…”

Investigation of CoPd alloys by XPS and EPES using the pattern recognition method

“…Studies of palladium cobalt alloys, as well as cobalt-palladium multilayers with layeralloyed modulations allowing to modify the magnetic properties, have been recently published in several reports [4][5][6][7][8][9][10]. The surface properties of palladium cobalt alloys and multilayers have been studied with the use of surface sensitive analytical methods, such as Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), X-ray absorption fine structure spectroscopy (EXAFS), X-ray diffraction (XRD), elastic peak electron spectroscopy (EPES) and thermal desorption spectroscopy (TDS).…”

“…non-fuzzy) k-nearest neighbour (kNN) and the fuzzy k-nearest neighbour (fkNN) rule have been already published [10,[15][16][17][18][19][20][21]. The crisp kNN rule has been applied for qualitative analysis from AES and XPS line shapes recorded at various carbons, polymers, silicon oxides and nitrides ( [16] and references contained), CoPd multilayers [8], while the first application of the fkNN rule for qualitative and quantitative XPS and XAES line shapes analysis was demonstrated for CoPd alloys [10], AuPd alloys [15], CuPd alloys [17], AuNi alloys [18], polycrystalline silicon [19] and sodium-potassium silicates [20,21].…”