XPS study of thin films of titanium oxysulfides

Gonbeau, Danielle; Guímon, C.; Pfister‐Guillouzo, G.; Levasseur, Alain; Meunier, G.; Dormoy, R.

doi:10.1016/0039-6028(91)90640-e

Cited by 349 publications

(200 citation statements)

References 19 publications

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“…Traces of nitrogen and fluorine were present at amounts less than two atomic percents. The oxygen and titanium regional scans showed no difference between the doped and the undoped samples; the O 1s peak, located at 531.0 eV, and D (Ti 2p1/2 À Ti 2p3/2) = 5.7 eV both agreed well with the literature values [35]. The C 1s peak from graphite was present in both samples, as presented in Fig.…”

Section: Characterization Of C-tio 2 Thin Filmsupporting

confidence: 88%

Photoeletrochemical generation of hydrogen over carbon-doped TiO2 photoanode

Zhou

Schulz

Lin

et al. 2009

Applied Catalysis B: Environmental

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Section: Characterization Of C-tio 2 Thin Filmsupporting

confidence: 88%

Photoeletrochemical generation of hydrogen over carbon-doped TiO2 photoanode

Zhou

Schulz

Lin

et al. 2009

Applied Catalysis B: Environmental

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“…The gap between Ti 2p 3/2 and Ti 2p 1/2 is 5 -6 eV, it is ascribed to Ti 4+ (458.9 eV) [17]. The Ti 3+ (456.8 eV) [17] only exists in Au/CuO x -TiO 2 . The intrinsic oxygen vacancy existed in TiO 2 , and Cu added in TiO 2 caused production of extrinsic oxygen vacancy.…”

Section: Xpsmentioning

confidence: 97%

Au/CuO<sub>x</sub>-TiO<sub>2</sub> Catalysts for CO Oxidation at Low Temperature

Duh¹,

Lee²,

Chen

2013

MRC

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A series of Au/CuO x -TiO 2 with various Cu/Ti ratios were prepared. CuO x /TiO 2 was prepared by incipient-wetness impregnation with aqueous solution of copper nitrate. Au catalysts were prepared by deposition-precipitation method at pH 7 and 338 K. The catalysts were characterized by inductively-coupled plasma-mass spectrometry, temperature programming reduction, X-ray diffraction, transmission electron microscopy, high-resolution transmission electron microscopy and X-ray photoelectron spectroscopy. The reaction was carried out in a fixed bed reactor with a feed containing 1% CO in air at WHSV of 120,000 mL/h·g. High gold dispersion and narrow size distribution was obtained. The addition of CuO x in Au/TiO 2 enhanced the activity on CO oxidation significantly. CuO x was in amorphous state which could stabilize the Au nanoparticles. Cu was in Cu 1+ state. Cu donated partial electrons to Au. The interactions among Au, Cu 1+ and TiO 2 account for the high catalytic activity for CO oxidation. The significant promotional effect of CuO x on CO oxidation at low temperature was demonstrated.

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“…From the analysis of the fitting components, the feature C at 453.8 eV can be assigned to the Ti 0 2p 3/2 peak of metallic Ti [38,39] 6.0 eV and the intensity ratio between the components is 1 : 2. These facts agree well with the characteristics of the 2p peak in metallic Ti [38].…”

Section: Hard X-ray Photoelectron Spectroscopy Investigationsmentioning

confidence: 99%

Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO₂(Ti)/SiO₂/Si stacks

Filatova¹,

Кожевников²,

Sokolov³

et al. 2012

Science and Technology of Advanced Materials

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(2012) Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO 2 (Ti)/SiO 2 /Si stacks, Science AbstractWe developed a mathematical analysis method of reflectometry data and used it to characterize the internal structure of TiO 2 /SiO 2 /Si and Ti/SiO 2 /Si stacks. Atomic concentration profiles of all the chemical elements composing the samples were reconstructed from the analysis of the reflectivity curves measured versus the incidence angle at different soft x-ray reflection (SXR) photon energies. The results were confirmed by the conventional techniques of hard x-ray photoelectron spectroscopy (HXPES) and high-resolution transmission electron microscopy (HRTEM). The depth variation of the chemical composition, thicknesses and densities of individual layers extracted from SXR and HXPES measurements are in close agreement and correlate well with the HRTEM images.

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XPS study of thin films of titanium oxysulfides

Cited by 349 publications

References 19 publications

Photoeletrochemical generation of hydrogen over carbon-doped TiO2 photoanode

Photoeletrochemical generation of hydrogen over carbon-doped TiO2 photoanode

Au/CuO<sub>x</sub>-TiO<sub>2</sub> Catalysts for CO Oxidation at Low Temperature

Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO₂(Ti)/SiO₂/Si stacks

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XPS study of thin films of titanium oxysulfides

Cited by 349 publications

References 19 publications

Photoeletrochemical generation of hydrogen over carbon-doped TiO2 photoanode

Photoeletrochemical generation of hydrogen over carbon-doped TiO2 photoanode

Au/CuO&lt;sub&gt;x&lt;/sub&gt;-TiO&lt;sub&gt;2&lt;/sub&gt; Catalysts for CO Oxidation at Low Temperature

Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO2(Ti)/SiO2/Si stacks

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Product

Resources

About

Au/CuO<sub>x</sub>-TiO<sub>2</sub> Catalysts for CO Oxidation at Low Temperature

Soft x-ray reflectometry, hard x-ray photoelectron spectroscopy and transmission electron microscopy investigations of the internal structure of TiO₂(Ti)/SiO₂/Si stacks