Abstract:Dense SiC-based composite ceramics were fabricated by means of the ex situ addition of TaC using solid-state spark plasma sintering (SPS). Commercially available β-SiC and TaC powders were chosen as raw materials. Electron backscattered diffraction (EBSD) analysis was conducted to investigate the grain boundary mapping of SiC-TaC composite ceramics. With the increase in TaC, the misorientation angles of the α-SiC phase shifted to a relatively small range. It was deduced that the ex situ pinning stress from TaC… Show more
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