We present a new fabrication method for epitaxial graphene on SiC which enables the growth of ultrasmooth defect-and bilayer-free graphene sheets with an unprecedented reproducibility, a necessary prerequisite for wafer-scale fabrication of high quality graphene-based electronic devices. The inherent but unfavorable formation of high SiC surface terrace steps during high temperature sublimation growth is suppressed by rapid formation of the graphene buffer layer which stabilizes the SiC surface. The enhanced nucleation is enforced by decomposition of polymer adsorbates which act as a carbon source. With most of the steps well below 0.75 nm pure monolayer graphene without bilayer inclusions is formed with lateral dimensions only limited by the size of the substrate. This makes the polymer assisted sublimation growth technique the most promising method for commercial wafer scale epitaxial graphene fabrication. The extraordinary electronic quality is evidenced by quantum resistance metrology at 4.2 K with until now unreached precision and high electron mobilities on mm scale devices. Main TextThe success of graphene as a basis for new applications depends crucially on the reliability of the available technologies to fabricate large areas of homogenous high quality graphene layers. Epitaxial growth on metals as well as on SiC substrates is employed with specific benefits and drawbacks.Single graphene layers epitaxially grown on SiC offer a high potential for electronic device applications. They combine excellent properties, e.g. high electron mobilities, with the opportunity for wafer-scale fabrication and direct processing on semi-insulating substrates without the need to transfer the graphene to a suitable substrate (Avouris & Dimitrakopoulos 2012). Some progress has been achieved during the recent years. In particular, high temperature sublimation growth under Ar atmosphere (Virojanadara et al. 2008),(Emtsev et al. 2009 or by confinement control (Heer et al. 2011), (Real et al. 2012) was a breakthrough for synthesizing large-area graphene on SiC substrates.The coverage of graphene bilayers could be reduced from wide stripes formed along the terraces to small micrometer-sized bilayer patches (Virojanadara et al. 2009). Further it was found that beyond pure sublimation growth from SiC graphene formation can be assisted by additional carbon supply from external sources (Al-Temimy et al. 2009;Moreau et al. 2010). In particular, by using propane in
Graphene-based materials have been suggested for applications ranging from nanoelectronics to nanobiotechnology. However, the realization of graphene-based technologies will require large quantities of free-standing two-dimensional (2D) carbon materials with tunable physical and chemical properties. Bottom-up approaches via molecular self-assembly have great potential to fulfill this demand. Here, we report on the fabrication and characterization of graphene made by electron-radiation induced cross-linking of aromatic self-assembled monolayers (SAMs) and their subsequent annealing. In this process, the SAM is converted into a nanocrystalline graphene sheet with well-defined thickness and arbitrary dimensions. Electric transport data demonstrate that this transformation is accompanied by an insulator to metal transition that can be utilized to control electrical properties such as conductivity, electron mobility, and ambipolar electric field effect of the fabricated graphene sheets. The suggested route opens broad prospects toward the engineering of free-standing 2D carbon materials with tunable properties on various solid substrates and on holey substrates as suspended membranes.
Temperature-driven structural transformations in Pb-based perovskite-type relaxors are studied by using polarized Raman spectroscopy, high-resolution powder, and synchrotron single-crystal x-ray diffraction applied to PbSc 0.5 Ta 0.5 O 3 ͑PST͒ and Pb 0.78 Ba 0.22 Sc 0.5 Ta 0.5 O 3 ͑PBST͒. The two compounds were chosen as model systems because PST is a relaxor that exhibits ferroelectric long-range order on cooling, whereas PBST shows canonical relaxor behavior. The temperature evolution of phonon anomalies and the pseudocubic unit-cell parameter for both PST and PBST reveals the existence of a characteristic temperature T ء between the Burns temperature T B and the temperature of the dielectric-permittivity maximum T m. T ء is associated with the coupling of initially nucleated small polar clusters and their aggregation into larger polar clusters. The temperature range between T B and T ء is characterized by a coupling between adjacent off-centered BO 6 octahedra to form initial polar clusters, while the range between T ء and T m is characterized by a coupling between off-centered B cations from adjacent polar clusters. Off-centered Pb atoms exist even above the Burns temperature and their length of coherence governs the coupling between polar regions comprising B-cation offcenter shifts and, consequently, directs the formation of the ferroelectric state to a normal, long-range ordered or nonergodic relaxor state.
A new single crystal from isotopically enriched silicon was used to determine the Avogadro constant N A by the x-ray-crystal density method. The new crystal, named Si28-23Pr11, has a higher enrichment than the former 'AVO28' crystal allowing a smaller uncertainty of the molar mass determination. Again, two 1 kg spheres were manufactured from this crystal. The crystal and the spheres were measured with improved and new methods. One sphere, Si28kg01a, was measured at NMIJ and PTB with very consistent results. The other sphere, Si28kg01b, was measured only at PTB and yielded nearly the same Avogadro constant value. The mean result for both 1 kg spheres is N A = 6.022 140 526(70) × 10 23 mol −1 with a relative standard uncertainty of 1.2 × 10 −8 . This value deviates from the Avogadro value published in 2015 for the AVO28 crystal by about 3.9(2.1) × 10 −8 . Possible reasons for this difference are discussed and additional measurements are proposed.
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