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The excitation power dependence of the ground and excited state transitions in type-II InAs-GaAs0.78Sb0.22 quantum dot structure has been studied. Both transitions exhibit a strong blueshift with increasing excitation power but their separation remains constant. This behavior indicates a carrier-induced electric field oriented predominantly along the growth axis, which requires the holes to be localized in the GaAsSb above quantum dots. An accelerated blueshift of the ground state emission is observed once the excited state in the dots starts to populate. This behavior can be explained by a smaller spontaneous recombination coefficient for the excited state transition.

The quantum cascade laser provides one potential method for the efficient generation of light from indirect materials such as silicon. While to date electroluminescence results from THz Si/SiGe quantum cascade emitters have shown higher output powers than equivalent III–V emitters, the absence of population inversion within these structures has undermined their potential use for the creation of a laser. Electroluminescence results from Si/SiGe quantum cascade emitters are presented demonstrating intersubband emission from heavy to light holes interwell (diagonal) transitions between 1.2 THz (250 μm) and 1.9 THz (156 μm). Theoretical modeling of the transitions suggests the existence of population inversion within the system.

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