BackgroundRoots are vital to plants for soil exploration and uptake of water and nutrients. Root performance is critical for growth and yield of plants, in particular when resources are limited. Since roots develop in strong interaction with the soil matrix, tools are required that can visualize and quantify root growth in opaque soil at best in 3D. Two modalities that are suited for such investigations are X-ray Computed Tomography (CT) and Magnetic Resonance Imaging (MRI). Due to the different physical principles they are based on, these modalities have their specific potentials and challenges for root phenotyping. We compared the two methods by imaging the same root systems grown in 3 different pot sizes with inner diameters of 34 mm, 56 mm or 81 mm.ResultsBoth methods successfully visualized roots of two weeks old bean plants in all three pot sizes. Similar root images and almost the same root length were obtained for roots grown in the small pot, while more root details showed up in the CT images compared to MRI. For the medium sized pot, MRI showed more roots and higher root lengths whereas at some spots thin roots were only found by CT and the high water content apparently affected CT more than MRI. For the large pot, MRI detected much more roots including some laterals than CT.ConclusionsBoth techniques performed equally well for pots with small diameters which are best suited to monitor root development of seedlings. To investigate specific root details or finely graduated root diameters of thin roots, CT was advantageous as it provided the higher spatial resolution. For larger pot diameters, MRI delivered higher fractions of the root systems than CT, most likely because of the strong root-to-soil contrast achievable by MRI. Since complementary information can be gathered with CT and MRI, a combination of the two modalities could open a whole range of additional possibilities like analysis of root system traits in different soil structures or under varying soil moisture.Electronic supplementary materialThe online version of this article (doi:10.1186/s13007-015-0060-z) contains supplementary material, which is available to authorized users.

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Background: Improving abiotic stress tolerance in wheat requires large scale screening of yield components such as seed weight, seed number and single seed weight, all of which is very laborious, and a detailed analysis of seed morphology is time-consuming and visually often impossible. Computed tomography offers the opportunity for much faster and more accurate assessment of yield components. Results: An X-ray computed tomographic analysis was carried out on 203 very diverse wheat accessions which have been exposed to either drought or combined drought and heat stress. Results demonstrated that our computed tomography pipeline was capable of evaluating grain set with an accuracy of 95-99%. Most accessions exposed to combined drought and heat stress developed smaller, shrivelled seeds with an increased seed surface. As expected, seed weight and seed number per ear as well as single seed size were significantly reduced under combined drought and heat compared to drought alone. Seed weight along the ear was significantly reduced at the top and bottom of the wheat spike. Conclusions: We were able to establish a pipeline with a higher throughput with scanning times of 7 min per ear and accuracy than previous pipelines predicting a set of agronomical important seed traits and to visualize even more complex traits such as seed deformations. The pipeline presented here could be scaled up to use for high throughput, high resolution phenotyping of tens of thousands of heads, greatly accelerating breeding efforts to improve abiotic stress tolerance.

One of the most challenging computer vision problem in plant sciences is the segmentation of root and soil from X-ray tomography. So far, this has been addressed from classical image analysis methods. In this paper, we address this root/soil segmentation problem from X-ray tomography using a new deep learning classification technique. The robustness of this technique, tested for the first time on this plant science problem, is established with root/soil presenting a very low contrast in X-ray tomography. We also demonstrate the possibility to segment efficiently root from soil while learning on purely synthetic soil and root.

One of the most challenging computer vision problems in the plant sciences is the segmentation of roots and soil in X-ray tomography. So far, this has been addressed using classical image analysis methods. In this paper, we address this soil-root segmentation problem in X-ray tomography using a variant of supervised deep learning-based classification called transfer learning where the learning stage is based on simulated data. The robustness of this technique, tested for the first time with this plant science problem, is established using soil-roots with very low contrast in X-ray tomography. We also demonstrate the possibility of efficiently segmenting the root from the soil while learning using purely synthetic soil and roots.