1998
DOI: 10.1063/1.367316
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1.3 μm InGaAsP/InP capped mesa buried heterostructure laser with an undoped cladding layer in base epitaxial growth

Abstract: A study of Zn diffusion behavior in capped mesa buried heterostructure lasers reveals the Zn profile in the base epitaxial region of InGaAsP/InP heterostructures to be dominated by diffusion during regrowth. This diffusion behavior has enabled us to fabricate a laser without any Zn doping in the p clad during base growth. The lasing characteristics at 25 °C are comparable to those of normally Zn-doped structures. The Zn diffusion into the undoped cladding layer, and thus, the temperature performance of these l… Show more

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Cited by 3 publications
(1 citation statement)
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“…This series of devices with different and identical current blocking offered an opportunity to separate "edge" current from active region current. Details of the structure design and growth can be found elsewhere [7]. We fabricated lasers with mesa widths of 1, 10, 60, and 100 m. The measured dependence of the threshold current on mesa width for 300-m cavity-length devices is shown in Fig.…”
Section: Experiments and Resultsmentioning
confidence: 99%
“…This series of devices with different and identical current blocking offered an opportunity to separate "edge" current from active region current. Details of the structure design and growth can be found elsewhere [7]. We fabricated lasers with mesa widths of 1, 10, 60, and 100 m. The measured dependence of the threshold current on mesa width for 300-m cavity-length devices is shown in Fig.…”
Section: Experiments and Resultsmentioning
confidence: 99%