1-D Cell Generation With Printability Enhancement

Wu, Pei-Chih; Chen, Tung-Chieh; Ho, Tsung-Yi; Chen, Yu-Chuan; Siao, Shun-Ren; Lin, Shu-Hung

doi:10.1109/tcad.2012.2226454

Cited by 9 publications

(9 citation statements)

References 18 publications

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“…The use of wireless sensor system networks can unite sensor networks in a decentralized manner. The use of these networks requires efficient hardware and software to collect data in large capacity and software algorithms that can anticipate the system overload communication [13].…”

Section: Related Workmentioning

confidence: 99%

A Fog Networks for Measuring the Physical Parameter of Greenhouse Plant

2018

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Greenhouse is a very effective method of matching and has been able to contribute to food independence in various countries. Plants that are in the greenhouse must be maintained with chemical-physical parameters in order to grow optimally. Monitoring of plants in greenhouses must always be done. Some monitoring reports have been made online so that they can provide solutions as quickly as possible if there is a disturbance on the plants. Unfortunately, online monitoring is still dependent on internet networks that require network infrastructure needs that have many limitations. As a result, many agricultural lands are not covered by the internet network to monitor the greenhouse. The use of a large number of sensor nodes also affects the decline in available broadband internet performance so as to reduce monitoring performance. In this research proposed a fog network that connects the sensor node with the local fog server via a WIFI network. Sensor node has been built with a system on chips WIFI-Microcontroller ESP8266 to perform data acquisition and temperature sensor data transmission, relative humidity and light intensity using the WIFI network to the fog server. In this study testing the accuracy of sensor parameters used and network performance by comparing with the use of cloud networks. From the tests performed, the results of Mean Absolute Percent Error (MAPE) were obtained for each parameter, temperature = 1.3%, humidity: 1.9% and light intensity: 0.6%. The use of the fog network has proven to not contribute significantly to the error value of measurement data sent to the server. The use of WIFI on the fog network requires less network broadband needs when compared to cloud networks. This difference is very significant, which is an average of 253 BPS if using a fog network and 1276 BPS if using a cloud network. From the experiments conducted, the use of networks for proven to have a high data transmission speed with value 471 ms when compared to the internet network with value 1349 ms. Variations in the number of sensor nodes up to 5 nodes do not significantly affect that speed.

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Section: Related Workmentioning

confidence: 99%

A Fog Networks for Measuring the Physical Parameter of Greenhouse Plant

2018

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“…Although manual standard cell designs are still widely used to get the best performance/area/power, etc. [7,8], automatic standard cell synthesis has been actively studied to achieve comparable design quality and shorter turnaround time [9][10][11][12][13][14][15]. Taylor et al [9] and Maly et al [10] have early studies on applying regular layout patterns in standard cell synthesis.…”

Section: Dfm In Standard Cell Designmentioning

confidence: 99%

Design for manufacturability and reliability in extreme-scaling VLSI

Roy

et al. 2016

Sci. China Inf. Sci.

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In the last five decades, the number of transistors on a chip has increased exponentially in accordance with the Moore's law, and the semiconductor industry has followed this law as long-term planning and targeting for research and development. However, as the transistor feature size is further shrunk to sub-14nm nanometer regime, modern integrated circuit (IC) designs are challenged by exacerbated manufacturability and reliability issues. To overcome these grand challenges, full-chip modeling and physical design tools are imperative to achieve high manufacturability and reliability. In this paper, we will discuss some key process technology and VLSI design co-optimization issues in nanometer VLSI.

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“…Suppose that pin wire segment wi is on the left of pin wire segment wj, constraint (18) is developed to prevent overlap of pairs of extended pins.…”

Section: Lp Formulation For I/o Pin Extensionmentioning

confidence: 99%

“…Tang and Yuan [13] studied the cell migra-tion problem where the conventional shape-based layouts are transformed to simplified layouts with restrictive design rule constraints. There are some cell synthesis works for conventional 2D cells [14,15], or 1D cells [16,17,18,19]. Recently, an I/O pin extension approach was proposed to alleviate the pin access problem [20].…”

Section: Introductionmentioning

confidence: 99%

Standard Cell Layout Regularity and Pin Access Optimization Considering Middle-of-Line

Wei

Pan

et al. 2015

Proceedings of the 25th Edition on Great Lakes Symposium on VLSI

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As minimum feature size and pitch spacing further decrease in advanced technology nodes, many new design constraints and challenges are introduced, such as regularity, middle of line (MOL) structures, and pin-access challenges. In this work, we propose a comprehensive study on standard cell layout regularity and pin access optimization. Given irregular cell layout from old technology nodes, our cell optimization tool can search unidirectional migrated result where the self-aligned double patterning (SADP) and MOL based design constraints are satisfied, and the pin-accessibility is optimized. This problem is formulated as a general integer linear programming (ILP), which may suffer from long runtime for some large standard cell cases. Therefore, we also develop a set of hybrid techniques to quickly search for high-quality solutions. The experimental results demonstrate the effectiveness of our approaches.

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1-D Cell Generation With Printability Enhancement

Cited by 9 publications

References 18 publications

A Fog Networks for Measuring the Physical Parameter of Greenhouse Plant

A Fog Networks for Measuring the Physical Parameter of Greenhouse Plant

Design for manufacturability and reliability in extreme-scaling VLSI

Standard Cell Layout Regularity and Pin Access Optimization Considering Middle-of-Line

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