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            noise in multicarrier systems

May, E.J.P.; Morgan, H.G.

doi:10.1049/el:19760006

Cited by 4 publications

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“…(The description 'semiconducting' must be taken to include carbon composition resistors and thin gold films as well as silicon resistors, diodes, etc, with apparently only the one common factor of a relatively small number of mobile charge carriers.) May and Morgan (1976) suggest that this proves that the excess noise is not due to fluctuations in resistance. On the other hand, Jones and Francis (1975) claimed that their finding of approximately zero correlation between different frequency components of l/f noise proved that no non-linear phenomenon was involved, and so a linear resistance fluctuation could be assumed.…”

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confidence: 70%

Harmonic generation in 1/f noise (resistors)

Bell¹

1976

J. Phys. D: Appl. Phys.

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Several observers have reported the peculiar phenomenon that passage of an alternating current through a semiconductor produces noise near zero frequency with 1/f spectrum, as well as producing 1/ Delta f sidebands on either side of the excitation frequency. Bull and Bozic (Br. J. Appl. Phys., vol.18, p.883 (1967)) reported the generation of white noise at low frequency. Re-examination of their data, taking account of the analysis of Lorteije and Hoppenbrouwers (Phillips Res. Rep., vol.26, p.29 (1971)), suggests that their experiment also produced 1/f noise plus 1/ Delta f noise, rather than white noise at low frequency.

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confidence: 70%

Harmonic generation in 1/f noise (resistors)

Bell¹

1976

J. Phys. D: Appl. Phys.

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Flicker Noise in Electronic Devices

Ziel

1979

Advances in Electronics and Electron Physics

210

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ac method for measuring low-frequency resistance fluctuation spectra

Scofield

1987

Review of Scientific Instruments

219

130

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An ac technique is described for measuring low-frequency resistance fluctuation spectra with improved sensitivity over dc methods achieved by avoiding preamplifier 1/f noise. The technique, easily implemented with decade resistors and a lock-in amplifier, allows the current noise of low-resistance (r<10 kΩ) specimens to be measured to frequencies below 1 mHz. Use of a center-tapped, four-probe specimen geometry allows discrimination between specimen and contact noise and eliminates noise due to bath temperature variations. The technique is demonstrated in use to determine the dependence of the 1/f noise of Cr films on film area. Measurements with simultaneous direct and alternating currents provide means to study the noise of nonlinear devices and frequency-dependent conductors.

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1/ f noise in multicarrier systems

Cited by 4 publications

References 1 publication

Harmonic generation in 1/f noise (resistors)

Harmonic generation in 1/f noise (resistors)

Flicker Noise in Electronic Devices

ac method for measuring low-frequency resistance fluctuation spectra

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