2015
DOI: 10.1063/1.4939132
|View full text |Cite
|
Sign up to set email alerts
|

(11-22) semipolar InGaN emitters from green to amber on overgrown GaN on micro-rod templates

Abstract: We demonstrate semipolar InGaN single-quantum-well light emitting diodes (LEDs) in the green, yellow-green, yellow and amber spectral region. The LEDs are grown on our overgrown semipolar (11-22) GaN on micro-rod array templates, which are fabricated on (11-22) GaN grown on m-plane sapphire. Electroluminescence measurements on the (11-22) green LED show a reduced blue-shift in the emission wavelength with increasing driving current, compared to a reference commercial c-plane LED. The blue-shifts for the yellow… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4

Citation Types

0
85
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
5
1

Relationship

1
5

Authors

Journals

citations
Cited by 46 publications
(85 citation statements)
references
References 27 publications
0
85
0
Order By: Relevance
“…It is worth noting that a very small number of extra dislocations are generated due to the 2nd coalescence. Our plan-view TEM image indicates that the overall dislocation density in our overgrown (11)(12)(13)(14)(15)(16)(17)(18)(19)(20)(21)(22) semi-polar GaN is about 4.2×10 8 cm −2 , demonstrating a significant reduction in dislocation density from the order of 10 10 cm −2 in the as-grown GaN which is used to fabricate into the micro-rod array template. Basal stacking faults (BSFs), as extended defects, can be observed along either the [-12-10] or the [2-1-10] zone-axis by tilting 30 • from the [1-100] zone-axis.…”
Section: Aip Advances 6 025201 (2016)mentioning
confidence: 99%
See 4 more Smart Citations
“…It is worth noting that a very small number of extra dislocations are generated due to the 2nd coalescence. Our plan-view TEM image indicates that the overall dislocation density in our overgrown (11)(12)(13)(14)(15)(16)(17)(18)(19)(20)(21)(22) semi-polar GaN is about 4.2×10 8 cm −2 , demonstrating a significant reduction in dislocation density from the order of 10 10 cm −2 in the as-grown GaN which is used to fabricate into the micro-rod array template. Basal stacking faults (BSFs), as extended defects, can be observed along either the [-12-10] or the [2-1-10] zone-axis by tilting 30 • from the [1-100] zone-axis.…”
Section: Aip Advances 6 025201 (2016)mentioning
confidence: 99%
“…The overgrowth initiates from the exposed sidewalls of micro-rods as shown in Figure 1(b), and the lateral growth is dominated by the growth along the [0001] direction labelled as c-direction and the [11][12][13][14][15][16][17][18][19][20] direction labelled as a-direction. Comparing the lengths of the two growing wings, the c-direction growth is faster than the a-direction growth.…”
Section: Aip Advances 6 025201 (2016)mentioning
confidence: 99%
See 3 more Smart Citations