12.2 Reliability and life time

Sumpf, B.; Häusler, K.

doi:10.1007/978-3-642-14177-5_10

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Reliability Test1

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2011

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“…Therefore, an exponential distribution was used to analyze the data. Assuming a random failure rate a statistical analysis [19,20] the lower limit of the mean time to failure MTTF can be calculated by using with (1−α) being the confidence limit of the MTTF, r being the number of failures, and χ 2 α (2r + 2) is the α-quantile of the χ 2 -function. The total test time TTT is the sum of all device hours of samples running in the test.…”

Section: Reliability Testmentioning

confidence: 99%

20 000 h reliable operation of 100 µm stripe width 650 nm broad area lasers at more than 1.1 W output power

Sumpf¹,

Fricke²,

Ressel³

et al. 2011

Semicond. Sci. Technol.

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Reliability tests for highly efficient high-power 650 nm broad area diode lasers will be presented. The devices have a 5 nm thick single GaInP quantum well as an active layer, which is embedded in AlGaInP waveguide layers and n-AlInP and p-AlGaAs cladding layers. The devices with a stripe width of 100 μm and a cavity length of 1.5 mm were soldered on diamond submounts and mounted on standard C-mounts for an efficient heat removal. The test was performed at a temperature of 15 • C over a first period of 10 000 h at 1.1 W followed by a second period of 10 000 h at 1.2 W. Based on the aging test and assuming a 60% confidence level, the lower limit of the mean time to failure of 87 000 h was determined for the devices.

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Section: Reliability Testmentioning

confidence: 99%