13.1: Invited Paper: Single‐Photon‐Capable Detector Arrays in CMOS—Exploring a New Tool for Display Metrology

Abstract

The technology of CMOS‐compatible Single Photon Avalanche Diodes is evolving rapidly and has matured to the point at which it can address the requirements of a range of imaging applications. In this report we consider the current suitability and future potential of CMOS‐compatible Single Photon Avalanche Diodes to address the particular application of display metrology.