15.1: A Novel VA Architecture for Improved Response Time

Sohn, Jeong-Ho; Choi, Nakcho; Huh, Chul; Lee, Dong‐Ki; Yoon, Juae; Jung, Minsik; Lyu, Jae‐Jin; Kim, Kyeong‐Hyeon; Souk, Jun H.

doi:10.1889/1.2433155

Cited by 3 publications

(1 citation statement)

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“…To ameliorate these drawbacks, a novel pixel ITO electrode with the slit pattern disposed at the boundary of reverse twist domain is proposed. Simulation of transmittance dynamic stability and other electricoptical characteristics of the proposed cell configuration were performed with the commercially available software "Techwiz LCD" (Sanayi System, South Korea), where the motion of the LC director is calculated based on the Eriksen-Leslie theory and the 2 x 2 Jones matrix is applied for the optical transmittance calculation [2,3].…”

Section: Introductionmentioning

confidence: 99%

P‐159: Slit Pattern for Dynamic Stability of TN‐VA LCD

Chen

Cui

Chung

et al. 2011

Symp Digest of Tech Papers

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We investigated the dynamic stability of disclination lines (DLs) generated near the boundary of adjacent domain with different Liquid crystal orientation in the conventional multi-domain twist nematic-vertical alignment (TN-VA) LCDs. The Liquid crystal molecules collide with each other at the reverse twist boundaries due to the strong reverse twist force competitions at a high voltage, and pushes DLs deeply penetrate into the active region, resulting in a decreased transmittance in the panel. To ameliorate these drawbacks, the slit pattern was induced at the location of reverse-twist boundary with the function to suppress the reverse twist force and eliminates the distortion, thus make DLs remain very slim near boundary areas. As a result, the transmittance dynamic stability is greatly improved.

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Section: Introductionmentioning

confidence: 99%