2022
DOI: 10.1007/s11664-022-09605-8
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2.2 kV Breakdown Voltage AlGaN/GaN Schottky Barrier Diode with Polarization Doping Modulated 3D Hole Gas Cap Layer and Polarization Junction Structure

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Cited by 3 publications
(2 citation statements)
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“…The breakdown voltage of GaN heterojunction devices is severely limited by the defect leakage at the interface between substrate and GaN buffer layer [1][2][3][4][5][6]. The defects also result in a large gap between the breakdown voltage of GaN devices and the theoretical value.…”
Section: The Advantages and Shortcomings Of Gan-based Schottky Diodementioning
confidence: 99%
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“…The breakdown voltage of GaN heterojunction devices is severely limited by the defect leakage at the interface between substrate and GaN buffer layer [1][2][3][4][5][6]. The defects also result in a large gap between the breakdown voltage of GaN devices and the theoretical value.…”
Section: The Advantages and Shortcomings Of Gan-based Schottky Diodementioning
confidence: 99%
“…Actual parameter value and theoretical limits of the devices based on different materialsThe electric field crowding effect of horizontal devices will impact the breakdown voltage. The electric field crowding effect refers to the uneven distribution of electric field in the loss layer when the Schottky diode bias is at a high back bias voltage[1][2][3][4][5]. A peak electric field at the electrode edge is determined by the proximity of the electrode edge and the intensity of the electric field line distribution.…”
mentioning
confidence: 99%