Abstract:Due to high technology requirements for modern display devices such as flexible, high resolution, thinner and higher transmission of polarizations, non‐destructive testing methods for evaluating quality of thin film plate polarizers are in high demand. In this paper, a system which can be used to observe defects and inhomogeneity of these thin film plate polarizers such as wide grid polarizers and thin film coating polarizers is proposed. This system consists of a collimated backlight light source, an afocal s… Show more
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