“…The capacitance–voltage ( C–V ) measurements are proceeded under dark condition to investigate the charge carrier trapping and accumulating behavior at the HTL/perovskite interfaces for p‐i‐n PVSCs based on different PTAA and Poly‐TPD HTLs according to the Mott–Schottky equation expressed as
, where the A , N , and V represent the active area of device, free carrier concentration, and applied bias. [
39 ] The C −2 – V curves are shown in Figure 6d and the corresponding V bi values are listed in Table S9, Supporting Information. The p‐i‐n PVSCs based on both the AMD treated PTAA and Poly‐TPD HTLs exhibit much larger V bi than those based on the pristine or CMD treated HTLs, which is because the AMD strategy can reduce the energy level offset by forming p–n homojunction at the HTL/perovskite buried interface, thereby enhancing the V bi of the corresponding p‐i‐n PVSCs.…”