2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) 2019
DOI: 10.1109/s3s46989.2019.9320656
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28 FDSOI RF Figures of Merit down to 4.2 K

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Cited by 7 publications
(3 citation statements)
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“…Recently, in [22], RF characterization of 28-nm FD SOI NMOSFETs at cryogenic temperatures down to 4.2 K was conducted. An improvement of up to ∼130 GHz in ft and ∼75 GHz in fmax was observed for the shortest device (25 nm) at low temperature.…”
Section: Low and High Temperature Performance Of Fd Soimentioning
confidence: 99%
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“…Recently, in [22], RF characterization of 28-nm FD SOI NMOSFETs at cryogenic temperatures down to 4.2 K was conducted. An improvement of up to ∼130 GHz in ft and ∼75 GHz in fmax was observed for the shortest device (25 nm) at low temperature.…”
Section: Low and High Temperature Performance Of Fd Soimentioning
confidence: 99%
“…The RF performance of 28 nm FD SOI transistors at cryogenic temperature under low bias conditions was also investigated in [22]. Fig.…”
Section: Low and High Temperature Performance Of Fd Soimentioning
confidence: 99%
“…In this paper, the main interesting features of the FD SOI CMOS technology for RF and millimeter-wave applications are presented. Firstly, the low-power and high-frequency performance of FD SOI [10]- [12] featuring various types of back gate contacts are shown for operation at cryogenic [13] and high temperature [14]. The benefit of the back gate biasing to improve the RF noise characteristics [15] as well as the transistor linearity [16] is demonstrated.…”
mentioning
confidence: 99%