Abstract:The paper presents a power efficient line driver for 3.125 Gb/s operation over FR-4 copper backplannes. The circuit has been implemented in 0.18µm and dissipates 28 mW from 1.8V power supply. Efficient ESD protection has been used that provided 2kV Human Body Model (HBM) reliability.
“…The results of mixed-mode simulations at 2 kV HBM ESD stress are depicted in Fig. 4-4 [17]. In this figure, Vg_M0 is the gate voltage of ESD transistor M 0 and V pad is the pad voltage at 2 kV HBM ESD stress applied to the I/O pad.…”
“…The results of mixed-mode simulations at 2 kV HBM ESD stress are depicted in Fig. 4-4 [17]. In this figure, Vg_M0 is the gate voltage of ESD transistor M 0 and V pad is the pad voltage at 2 kV HBM ESD stress applied to the I/O pad.…”
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.