2002
DOI: 10.1088/0953-8984/14/48/380
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 310  misfit dislocations in ZnSe/GaAs(001) heterostructure

Abstract: Strain relaxation in ZnSe/GaAs(001) heterostructure grown by molecular beam epitaxy is studied by transmission electron microscopy. In as-grown samples, an array of perfect misfit dislocations, lying along 310 directions, with Burgers vector (1/2) 011 inclined to the interface is observed. The corresponding threading segments propagate by glide in {331} planes, leaving misfit segments in the interface.From a mechanical equilibrium analysis, it is concluded that, in the case of low misfit (0.27%), the critical … Show more

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Cited by 6 publications
(8 citation statements)
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“…4); that is {133} glide is favoured as compared to {111} glide. (These calculations are performed by considering that the Peierls potential plays only a minor role [5]: indeed the growth temperature range is in the athermal regime of dislocation glide). Note that because of the fourfold symmetry of the misfit stress, all eight 1/2<011>{133} systems are equally stressed.…”
Section: Discussionmentioning
confidence: 99%
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“…4); that is {133} glide is favoured as compared to {111} glide. (These calculations are performed by considering that the Peierls potential plays only a minor role [5]: indeed the growth temperature range is in the athermal regime of dislocation glide). Note that because of the fourfold symmetry of the misfit stress, all eight 1/2<011>{133} systems are equally stressed.…”
Section: Discussionmentioning
confidence: 99%
“…Since the Burgers vector of dislocations A is inclined to the interface, these are not the most efficient strain-releasing misfit dislocations. Dislocations lying along <110> directions within the interface plane and with in-plane 1/2<110> Burgers vector are most efficient (efficient component 0.71 a) and are indeed observed in fully relaxed material [5]. From the efficient Burgers vector component and the mean distance between interfacial dislocations, the misfit strain that is released by the observed network is estimated as 6x10 -4 , to be compared to the crystallographic misfit: 27x10 -4 .…”
Section: Characterisation Of Interfacial Dislocationsmentioning
confidence: 99%
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“…Both the structure and physical properties of flat and island films are strongly influenced by misfit stresses whose relaxation often occurs by the nucleation of misfit dislocations (MDs) in film-substrate composite solids (see, for example, [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17]). MDs in flat films form if the film thickness exceeds a critical value, which depends on the misfit between the crystal lattice parameters of the film and the substrate (see, for example, the pioneering works [18][19][20], reviews [21,22] and book [23]).…”
Section: Introductionmentioning
confidence: 99%
“…A partial relaxation of misfit stresses often occurs by nucleation and evolution of misfit dislocations (MDs) at interphase boundaries in thin-film and bulk nanocomposites; see, e.g., [8][9][10][11][12][13][14][15][16][17][18][19][20]. Commonly misfit stress relaxation is realized through the nucleation of MD semiloops at the free surface, their subsequent glide to the interphase boundary and further expansion [8,9].…”
mentioning
confidence: 99%