2015
DOI: 10.1155/2015/179304
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3D Imaging of Dielectric Objects Buried under a Rough Surface by Using CSI

Abstract: A 3D scalar electromagnetic imaging of dielectric objects buried under a rough surface is presented. The problem has been treated as a 3D scalar problem for computational simplicity as a first step to the 3D vector problem. The complexity of the background in which the object is buried is simplified by obtaining Green's function of its background, which consists of two homogeneous half-spaces, and a rough interface between them, by using Buried Object Approach (BOA). Green's function of the two-part space with… Show more

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Cited by 8 publications
(5 citation statements)
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“…Previously, buried pipe monitoring based on the joint use of finite-difference time-domain method (FDTD) numerical modeling and linear tomographic inversion methods was investigated [5]. Besides, both two and three-dimensional problems for a buried object under a rough surface were analyzed by analytical and numerical approaches [6,7]. In these studies, first, Green's function of the corresponding problem was obtained.…”
Section: Introductionmentioning
confidence: 99%
“…Previously, buried pipe monitoring based on the joint use of finite-difference time-domain method (FDTD) numerical modeling and linear tomographic inversion methods was investigated [5]. Besides, both two and three-dimensional problems for a buried object under a rough surface were analyzed by analytical and numerical approaches [6,7]. In these studies, first, Green's function of the corresponding problem was obtained.…”
Section: Introductionmentioning
confidence: 99%
“…Among the various possible approaches to inspect underground structures, microwave imaging provides the ability to characterize subsoil regions based on scattering measurements collected by antennas placed over the area of interest. These techniques can be used to non-invasively determine the presence and the approximate shape of buried objects (in the case of qualitative methods [ 10 , 11 , 12 , 13 , 14 , 15 , 16 ]) or the distribution of their dielectric properties (in the case of quantitative strategies [ 17 , 18 , 19 , 20 , 21 , 22 , 23 , 24 , 25 ]).…”
Section: Introductionmentioning
confidence: 99%
“…The possibility of obtaining a point-by-point characterization of dielectric structures from noninvasive measurements of the scattered electromagnetic field has attracted the attention of scientists and researchers for decades [1][2][3][4][5][6][7][8][9][10]. Basically, the quantitative retrieval of the dielectric properties of a structure under test from scattered-field data is associated with the solution of an inverse problem [3], which is nonlinear (if no simplifying model approximations are made) and typically ill-posed.…”
Section: Introductionmentioning
confidence: 99%