2012
DOI: 10.1117/12.922530
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3D metrology system based on a bi-directional OLED microdisplay

Abstract: Expanding demands on manufacturing technology increase the requirements on necessary non-contact metrology. Several optical metrology systems are based on separated imaging (e.g. camera unit) and image generating units (e.g. projection unit). This fact limits the geometrical miniaturization of the system. We present a compact, highly integrated 3-D metrology system based on the fringe projection principle using a bi-directional OLED microdisplay. The microdisplay combines light emitting pixels based on OLED te… Show more

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References 14 publications
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