2022
DOI: 10.1016/j.matchemphys.2021.125635
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3D micromorphology-contact resistance-conductivity insights of quasi 2D Cd1-xPbxS thin films: Investigation based on stereometric and fractal analysis

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Cited by 11 publications
(5 citation statements)
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“…Similarly, lower and statistically similar degree of surface percolation is observed for all the analyzed films with FS ≤ 0.5. [54,70] A lower degree of microtexture porosity or surface percolation for TNO5 despite its highest roughness can be attributed to the higher uniformity in its surface.…”
Section: Monofractal Analysismentioning
confidence: 99%
“…Similarly, lower and statistically similar degree of surface percolation is observed for all the analyzed films with FS ≤ 0.5. [54,70] A lower degree of microtexture porosity or surface percolation for TNO5 despite its highest roughness can be attributed to the higher uniformity in its surface.…”
Section: Monofractal Analysismentioning
confidence: 99%
“…By extension, most of the properties of thin film surfaces can be explained via fractal characterizations. Some of these properties include surface wettability [52], electrical [26], electrochemistry [53,54], nano-indentation [55], fouling [56], optical [57] and other properties. Fractal studies have been reported for various thin film materials based on the application of such films, according to the keyword analysis in Figure 6.…”
Section: Keyword Analysismentioning
confidence: 99%
“…[ 26 ] In recent years, fractal geometry‐based parameters have been extensively used to investigate the dynamics of surface morphology and roughness in thin films, correlating them with properties like supercapacitance, contact resistance, wettability, and conductivity. [ 27–30 ] Advanced fractal parameters, including lacunarity, fractal succolarity (FC), and surface entropy, offer insights into surface texture heterogeneity, surface percolation, and uniformity in height distribution. [ 31–33 ]…”
Section: Introductionmentioning
confidence: 99%
“…[26] In recent years, fractal geometry-based parameters have been extensively used to investigate the dynamics of surface morphology and roughness in thin films, correlating them with properties like supercapacitance, contact resistance, wettability, and conductivity. [27][28][29][30] Advanced fractal parameters, including lacunarity, fractal succolarity (FC), and surface entropy, offer insights into surface texture heterogeneity, surface percolation, and uniformity in height distribution. [31][32][33] In electrodeposition, the growth mechanism, morphology, and microstructural properties of the film depend on various conditions, including pH, additives, electrolyte composition, current density, or deposition potential.…”
mentioning
confidence: 99%