2015 Asia-Pacific Microwave Conference (APMC) 2015
DOI: 10.1109/apmc.2015.7413232
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3D momentum modeling technique and measurements of CPW compact GaAs multilayer MMICs

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Cited by 5 publications
(9 citation statements)
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“…The accuracy in design and simulation of SPST and SPDT pHEMT switches is ensured by comparing the simulated and measured data with the extracted data obtained from the small-signal model. Our investigations in several multilayer devices utilising pHEMT have shown that the differences between the simulated and measured results are due to the use of standard TOM3 model in ADS simulation tool, which does not consider the effect of multilayer processing as discussed in Section 2 [17]. Besides that, the measurements do not reflect the actual results since the effects of the internal VNA features and the test fixtures are not considered due to calibration reference plane used.…”
Section: Measurement Results and Discussionmentioning
confidence: 95%
“…The accuracy in design and simulation of SPST and SPDT pHEMT switches is ensured by comparing the simulated and measured data with the extracted data obtained from the small-signal model. Our investigations in several multilayer devices utilising pHEMT have shown that the differences between the simulated and measured results are due to the use of standard TOM3 model in ADS simulation tool, which does not consider the effect of multilayer processing as discussed in Section 2 [17]. Besides that, the measurements do not reflect the actual results since the effects of the internal VNA features and the test fixtures are not considered due to calibration reference plane used.…”
Section: Measurement Results and Discussionmentioning
confidence: 95%
“…There are several simulation steps in designing MMIC using simulators such as Agilent ADS Momentum© which are suitable for designing layout components i.e. defining substrate, settingup ports, defining frequency and output plans as well as defining mesh simulation [6]. The followings are important parameters that need to be taken into account for accurate layout simulation.…”
Section: Methodsmentioning
confidence: 99%
“…Gold is a type of conductor with a very good conductivity. Component characteristic losses resulting from default simulation settings do not represent accurate losses that occur in the fabricated component in onwafer measurements [6]. This is caused by the laying operation of the conductor layer in the default simulation parameters.…”
Section: Methodsmentioning
confidence: 99%
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