2002
DOI: 10.1889/1.1830207
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54.1:Invited Paper:A Novel Cathode for CRTs based on Hopping Electron Transport

Abstract: The Hopping Electron Cathode (HEC) is a novel low-drive electron source, which can be used in CRTs to reduce the cost of the set electronics and to improve the image quality. It is based on a self-regulating secondary emission process enabling transport of electrons over insulating surfaces. The HEC utilizes this mechanism to compress electrons coming from a large conventional cathode into a small funnel structure of insulating material. The exit of the funnel serves as a high-brightness electron source for a … Show more

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Cited by 3 publications
(4 citation statements)
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“…In this approach electrons from each subpixel are transported in a hopping mode via secondary electron emission over the wall of a funnel placed above the subpixel emitters. The self-regulating secondary electron emission has been previously applied for a flat thin cathode-ray panel [31] and a high-brightness electron source for CRT applications [32].…”
Section: Field-emission Displays (Feds)mentioning
confidence: 99%
“…In this approach electrons from each subpixel are transported in a hopping mode via secondary electron emission over the wall of a funnel placed above the subpixel emitters. The self-regulating secondary electron emission has been previously applied for a flat thin cathode-ray panel [31] and a high-brightness electron source for CRT applications [32].…”
Section: Field-emission Displays (Feds)mentioning
confidence: 99%
“…To lower the potential difference required the funnel walls should preferably be covered with a material with a high secondary electron emission coefficient. The principle has been applied in a thin and flat display employing wire cathodes [1,2], as well as in the HEC-CRT electron source which was mentioned earlier [3]. In the latter case, the electron transport was demonstrated under high current densities as required in a CRT.…”
Section: Basic Architecturementioning
confidence: 99%
“…Especially MgO degradation under electron bombardment is a concern. For the HEC-CRT cathode, current stability was already promising [3,5]. For the HopFED funnel degradation is, due to the much lower current, expected not to be critical.…”
Section: Hop Plate Lifetime Aspectsmentioning
confidence: 99%
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