55‐4: Novel Methodology for Reproducibility of OLED Lifetimes and Identification of Killer Impurities

Fujimoto, Hiroshi; Nakamura, Toshimitsu; Nagayoshi, Kaori; Harada, Kentaro; Miyazaki, Hiroshi; Kurata, Takaomi; Kiyota, Junya; Adachi, Chihaya

doi:10.1002/sdtp.13996

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P-116 / R Mac Ciarnáin1

Oled Deposition With Controlled H2o Partial Pressure1

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2021

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“…D3 should have a higher water content but D3 has a lower luminance decrease than D4 for both driving conditions. This could be attributed as a good approximation of the maximum lifetime error caused by device variation [12]. So, it can be concluded that diffusion of water in the devices is not a dominant effect.…”

Section: P-116 / R Mac Ciarnáinmentioning

confidence: 77%

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P‐116: TADF OLED Emission Zone and Stability Analysis with Water Exposure to Different Layers During Deposition

Ciarnaín

Mo²,

Nagayoshi³

et al. 2021

Symp Digest of Tech Papers

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Reliable devices are essential for the commercialization of OLED technology. OLED materials are notorious for their sensitivity to various substances such as water. For thermally activated delayed emission (TADF) OLEDs, which layers are most water‐sensitive is unknown. Work towards understanding how water affects OLED performance is shown. Surprisingly, it is shown that the water effect on the emission layer is negligible compared to other layers in this stack. The emission zone is measured for fresh and degraded OLEDs deposited under different water partial pressures. Using a novel highly sensitive measurement method, a shift to the anode side was observed.

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Section: P-116 / R Mac Ciarnáinmentioning

confidence: 77%

“…The deposition time, rate and thickness of each OLED layer was precisely controlled by a computer program and associated sensor system. Individual layer deposition times for different device runs were kept constant to obtain less fluctuations in the device lifetime [12]. 1.…”

Section: Oled Deposition With Controlled H2o Partial Pressurementioning

confidence: 99%