2007
DOI: 10.1109/rfic.2007.380945
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65 nm HR SOI CMOS Technology: emergence of Millimeter-Wave SoC

Abstract: Today, measurement of 65 nm CMOS [1] and 130nm-based SiGe HBTs [2] technologies demonstrate both F T (current gain cut-off frequency) and Fmax (maximum oscillation frequency) higher than 200 GHz, which are clearly comparable to advanced commercially available 100 nm III-V HEMT. Consequently, the integration of full transceiver at 60 GHz has been achieved both in SiGe bipolar [3] and CMOS technology [4].In the same time passive circuits working @ 220 GHz have been achieved and characterized on High Resistivity … Show more

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Cited by 10 publications
(2 citation statements)
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“…We present a 65nm RF SOI CMOS technology, targeted as Low Power (LP) to serve mobile applications. The integration has been made on 300mm SOI wafers with a High Resistive (HR) back substrate (> 1kOhm-cm) to improve RF performances [1,2]. The initial SOI film thickness is 70nm on top of a 145nm thick oxide (see cross section in Figure 1).…”
Section: Technology Descriptionmentioning
confidence: 99%
See 1 more Smart Citation
“…We present a 65nm RF SOI CMOS technology, targeted as Low Power (LP) to serve mobile applications. The integration has been made on 300mm SOI wafers with a High Resistive (HR) back substrate (> 1kOhm-cm) to improve RF performances [1,2]. The initial SOI film thickness is 70nm on top of a 145nm thick oxide (see cross section in Figure 1).…”
Section: Technology Descriptionmentioning
confidence: 99%
“…
We present a 65nm RF SOI CMOS technology, targeted as Low Power (LP) to serve mobile applications. The integration has been made on High Resistive (HR) back substrate 300mm SOI wafers from SOITEC to improve performances in high frequency range, compared to bulk [1,2]. For the first time, low leakage SRAM (Isb< 10pA at 0.9V, 25°C, for 0.62µm 2 and 0.52µm 2 cells) are integrated on these HR wafers, and the paper reports a 30% power reduction in operation for a given maximum speed, compared to similar SRAM design on bulk.
…”
mentioning
confidence: 99%