76- to 81-GHz CMOS Built-In Self-Test With 72-dB C/N and Less Than 1 ppm Frequency Tolerance for Multi-Channel Radar Applications

Kohtani, Masato; Murakami, Tomotoshi; Utagawa, Yoshiyuki; Arai, Tomomi; Yamaura, Shin Ichi

doi:10.1109/jssc.2021.3066214

Cited by 5 publications

(8 citation statements)

References 13 publications

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“…In [59], a 200 fF metal-insulatormetal (MIM) capacitor is used to achieve the same effect. An interesting approach to capacitively couple the BIST signal to the RF path has been demonstrated in the automotive radar transceiver from [50]: Couplers are integrated into the RF bond pads as shown in Fig. 10b.…”

Section: B Capacitive Couplingmentioning

confidence: 99%

“…Another automotive radar with integrated BIST generator is presented in [50]. Its test signal generation is shown in Fig.…”

Section: Introductionmentioning

confidence: 99%

“…FIGURE 7:Published test signal generators for automotive radar: Direct digital synthesis and quadrature modulator[1] (a) and signal generator with a single mixer followed by a phase shifter (from[50]) (b).…”

mentioning

confidence: 99%

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Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Wenger,

Meinerzhagen,

Issakov

2024

IEEE Access

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With automotive radar and 5G/6G communications, mass-market applications for millimeterwave circuits in silicon technologies have been identified or established in recent years. For high-volume, millimeter-wave integrated circuits, operating roughly between 30 GHz and 300 GHz, testability is a major concern, both from an overall cost as well as a quality assurance perspective. A solution for cost effective, low-overhead test of millimeter-wave integrated circuits is the integration of built-in self-test (BIST) features into the high-frequency front-end. Because BIST is an emerging topic in high-frequency circuit design, the field is still very fragmented. A plethora of different system concepts as well as building blocks have been proposed in recent years. This paper tries to provide a comprehensive overview of the state of the art in millimeter-wave BIST in an attempt to drive the field towards identification of standardized self-test solutions.INDEX TERMS Built-in self-test, CMOS, millimeter-wave transceivers, SiGe, silicon.

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Section: B Capacitive Couplingmentioning

confidence: 99%

“…Another automotive radar with integrated BIST generator is presented in [50]. Its test signal generation is shown in Fig.…”

Section: Introductionmentioning

confidence: 99%

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Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Wenger,

Meinerzhagen,

Issakov

2024

IEEE Access

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“…Consequently, a range from −10 to 20 dBm should be considered. Coupling factors of directional couplers proposed for BIST range between 10 and 23 dB [26], [28], [34], [35].…”

Section: B Power Levels In Typical Test Scenariosmentioning

confidence: 99%

Differential-Mode Power Detection for Built-In Self-Test of SiGe Automotive Radar Transceiver Front Ends

Wenger,

Ng,

Korndörfer

et al. 2024

IEEE Trans. Microwave Theory Techn.

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Recently, the feasibility of differential-mode power detection for built-in self-test (BIST) in millimeter-wave SiGe transceiver front ends has been demonstrated. In this work, a system analysis of typical BIST scenarios is performed. Specifications for the input power levels as well as the accuracy of power detectors are derived from this analysis. A need for at least two different differential detector architectures is identified. Two detectors are derived from the differential power measurement concept, analyzed, and implemented in the 76-81-GHz automotive radar frequency band. They feature a low power consumption of 500 µW and, to the authors' best knowledge, the lowest published circuit areas of approximately 0.005 mm 2 while still being input matched to the differential 100 system impedance. Both these characteristics are essential to keep the overhead of the BIST minimal. With dynamic ranges of 30 dB and up to 46 dB for the two different architectures, the differential power detector concept can achieve sufficient performance for BIST applications. The robustness against process and temperature effects as well as noise is analyzed and reported for both detectors.

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“…It is challenging to achieve coherent sampling for a high precision ADC. Especially for a built-in self-test (BIST) [7][8][9][10][11], it is difficult to integrate a high-performance signal and clock generator due to the limitation of the chip area. Therefore, there is an urgent demand for a testing method that eliminates the requirement of coherent sampling.…”

Section: Introductionmentioning

confidence: 99%

Research on Cosine-Sum Windows with Maximum Side-Lobe Decay for High Precision ADC Spectral Testing

Zhong

Song

et al. 2022

Electronics

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Achieving coherent sampling has always been a major challenge in analog-to-digital converter (ADC) spectral testing. If the coherent sampling condition cannot be met, leakage appears in the spectrum, which results in inaccurate parameters. The windowing method is widely used to process ADC data to eliminate leakage. However, this method requires prior knowledge about the type of window, and some commonly used windows cannot provide accurate results for a high precision ADC. In this paper, some general principles for optimizing the cosine-sum window and some windows with maximum side-lobe decay have been presented. A test method for eliminating the leakage caused by non-coherent sampling is also proposed. The proposed method can accurately evaluate the dynamic parameters of an ADC with arbitrary non-coherency. Various simulation results and measurement data demonstrate the functionality and robustness of the proposed method. The proposed method significantly relaxes the condition of coherent sampling and decreases the test cost.

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76- to 81-GHz CMOS Built-In Self-Test With 72-dB C/N and Less Than 1 ppm Frequency Tolerance for Multi-Channel Radar Applications

Cited by 5 publications

References 13 publications

Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Built-In Self-Test of Millimeter-Wave Integrated Front-End Circuits: How Far Have We Come?

Differential-Mode Power Detection for Built-In Self-Test of SiGe Automotive Radar Transceiver Front Ends

Research on Cosine-Sum Windows with Maximum Side-Lobe Decay for High Precision ADC Spectral Testing

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