“…The competitive superiority of a-IGZO TFTs is based on the fact that they can offer high carrier mobility, high optical transparency, and low off-state leakage compared with traditional Si-based TFTs [1][2][3], and their manufacturing cost is lower than that of lowtemperature polycrystalline silicon (LTPS) TFTs with large-area uniformity [4,5]. However, due to the high density of subgap defects existing in the bandgap of a-IGZO, the carrier mobility (µ FE ) and electrical stability are insufficient for advanced display applications such as AR/VR displays, flexible logic circuits, three-dimensional (3D) displays, and low-power mobile devices [6][7][8][9]. It has been reported that the subgap states mainly originate from oxygen vacancy-related defects induced by the structural disorder in a-IGZO [10], which affects the electrical properties and stability of TFTs by trapping electrons or holes in the channel layer and device interfacial region under gate bias stress, light illumination, and thermal stress [11].…”