Near-Surface Geophysics 2005
DOI: 10.1190/1.9781560801719.ch8
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8. Near-Surface Seismology: Surface-Based Methods

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Cited by 20 publications
(16 citation statements)
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“…This technology has been employed for a variety of near-surface investigations related to archaeological sites, subsurface contamination, geotechnical engineering problems, groundwater resources, and earthquake hazards ͑see Pelton, 2005 for an extensive list͒. Most of these investigations have been conducted since about 1990, and it is expected that more will be conducted in the future.…”
Section: Introductionmentioning
confidence: 99%
“…This technology has been employed for a variety of near-surface investigations related to archaeological sites, subsurface contamination, geotechnical engineering problems, groundwater resources, and earthquake hazards ͑see Pelton, 2005 for an extensive list͒. Most of these investigations have been conducted since about 1990, and it is expected that more will be conducted in the future.…”
Section: Introductionmentioning
confidence: 99%
“…Data acquisition requires more geophones (a geophone is a seismometer, a transducer that converts ground motion [usually up and down] into an electrical signal), more energy source points, and substantially more data. The low wave velocities in the near surface can also be problematic when scaling down this technique, which was originally designed for use in petroleum exploration (Pelton 2005).…”
Section: Seismic Refractionmentioning
confidence: 99%
“…The seismic refraction method depends on seismic waves that are transmitted through (rather than reflected from) the earth (Pelton 2005;Telford, Geldart, and Sheriff 1990; Reynolds 1997). The ray paths taken by these waves are distorted by refraction at velocity changes.…”
Section: Seismic Refractionmentioning
confidence: 99%
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“…Seismic refraction methods are commonly used to characterize the near-surface in environmental and engineering studies (e.g., Pelton, 2005). There are many different methods for obtaining a velocity model from seismic refraction first-arrival times, ranging from forward modeling to analytic and geometrical methods to inverse and tomographic methods (e.g., Palmer, 1980;Zelt and Smith, 1992;Sheehan et al, 2005;Ellefsen 2009).…”
Section: Introductionmentioning
confidence: 99%