Untitled

VanLandingham, Mark R.; McKnight, Steven H.; Palmese, Giuseppe R.; Eduljee, R. F.; Gillespie, John W.; McCULOUGH, Jr. R. L.

doi:10.1023/a:1018533708655

Cited by 73 publications

(44 citation statements)

References 3 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…6 By modeling the tipsample interaction as two springs in series, the mechanical response of the sample can be determined from the contact portion of the resulting force curve. 7 Rosa-Zeiser et al 8 used the pulsed-force mode of the scanning force microscope to image elastic, electrostatic, and adhesive properties simultaneously with topography. By modeling the tip-sample interaction using a spring-dashpot system, Burnham et al 9 were able to image local energy dissipation through impacts using a scanning probe microscopy method.…”

Section: Introductionmentioning

confidence: 99%

Contact-resonance atomic force microscopy for viscoelasticity

Yuya

Hurley

Turner

2008

Journal of Applied Physics

163

189

View full text Add to dashboard Cite

We present a quantitative method for determining the viscoelastic properties of materials with nanometer spatial resolution. The approach is based on the atomic force acoustic microscopy technique that involves the resonant frequencies of the atomic force microscopy cantilever when its tip is in contact with a sample surface. We derive expressions for the viscoelastic properties of the sample in terms of the cantilever frequency response and damping loss. We demonstrate the approach by obtaining experimental values for the storage and loss moduli of a poly͑methyl methacrylate͒ film using a polystyrene sample as a reference material. Experimental techniques and system calibration methods to perform material property measurements are also presented.

show abstract

Section: Introductionmentioning

confidence: 99%

Contact-resonance atomic force microscopy for viscoelasticity

Yuya

Hurley

Turner

2008

Journal of Applied Physics

163

189

View full text Add to dashboard Cite

show abstract

“…100 Hz, although custom-built instruments have attained w10 4 Hz [14]. Atomic force microscopes (''nanoindenters'') operate as high as 1 MHz [15,16] but only probe the surface [17]. While timeetemperature superpositioning is often invoked to extend the effective frequency range of test data, the results are inaccurate for measurements in the glass transition zone [18e22].…”

Section: Introductionmentioning

confidence: 99%

High strain rate mechanical behavior of polyurea

Roland

Twigg

et al. 2007

Polymer

278

164

View full text Add to dashboard Cite

“…This calculation, however, assumes that the particle is a perfect sphere attached to the tip of the cantilever, and any change on the cantilever resonant frequency due to the exact position of the particle on the tip was considered negligible [19,20].…”

Section: Effective Spring Constant For the Modified Probe-tipmentioning

confidence: 99%