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As no methodology was found in the literature for characterizing ceramic pigments chemically and mineralogically, the present study was undertaken to establish a methodology for the chemical and phase characterization of ceramic pigments by x-ray fluorescence (XRF) spectrometry and x-ray diffraction (XRD). In view of the large number of pigments described in the literature (around 44), the present study was limited to characterizing pigments that contained chromium, which is the most versatile chromophore used in ceramics.

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Characterization of chromium‐containing ceramic pigments by XRF and XRD

Gazulla

Gómez

Barba

et al. 2004

X-Ray Spectrometry

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Characterisation of cobalt-containing ceramic pigments by WD-XRF and XRD

et al. 2006

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A methodology previously established by the authors for the chemical and phase characterisation of chromium‐containing ceramic pigments by wavelength‐dispersive x‐ray fluorescence (WD‐XRF) spectrometry and x‐ray diffraction (XRD) has been adapted and applied to the characterisation of cobalt‐containing ceramic pigments typically used in the traditional ceramic industry. The present study was needed because the physical and chemical characteristics of cobalt‐containing ceramic pigments are quite different from those of the chromium‐containing ones. Copyright © 2006 John Wiley & Sons, Ltd.

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Magnetic anisotropy of epitaxial zinc ferrite thin films grown by pulsed laser deposition

et al. 2013

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Cited by 3 publications

References 10 publications

Characterization of chromium‐containing ceramic pigments by XRF and XRD

Characterization of chromium‐containing ceramic pigments by XRF and XRD

Characterisation of cobalt-containing ceramic pigments by WD-XRF and XRD

Magnetic anisotropy of epitaxial zinc ferrite thin films grown by pulsed laser deposition

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