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Iov, Valentin; Klier, Jürgen; Leiderer, Paul

doi:10.1023/a:1013757421112

Cited by 7 publications

(3 citation statements)

References 13 publications

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“…In this case, we performed wavelength scans of the light from 300 to 800 nm. The results have been discussed elsewhere [29]. We concluded that the work function of the Cs is about 1.9 eV, in good agreement with the values found for bulk Cs [30], showing that the films prepared by our evaporation method are rather pure.…”

Section: The Non-wetting 'Thin-film'supporting

confidence: 86%

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Liquid⁴He on Cs: drying, depinning, and the non-wetting ‘thin-film’

Reinelt¹,

Iov²,

Leiderer³

et al. 2005

J. Phys.: Condens. Matter

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Liquid 4 He shows a dewetting phase on Cs and Rb at low temperatures. These are the only substrates which are not wetted by 4 He. On Cs the wetting temperature, T w , is about 2 K. Usually one observes a thick metastable helium film remaining on the Cs substrate when either the surface is cooled below T w (so starting from a wet film) or when bulk helium (in the form of a drop or an advancing film) is deposited on the Cs. The contact line of this film is generally very stable and so there is no dewetting. However, we have observed that spontaneous drying of helium on Cs can occur and that contact lines can recede for temperatures close to T w . This exceptional behaviour is analysed and the dependence of substrate roughness is discussed. Furthermore, we have studied the non-wetting 'thin-film' of liquid 4 He on Cs. Far away from coexistence this film grows as a two-dimensional (2D) gas until about one monolayer is obtained, then remains nearly constant for a certain range of chemical potential and, close to coexistence, rapidly forms a thicker 2D-liquid-like film as stable thermodynamical solution.

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Section: The Non-wetting 'Thin-film'supporting

confidence: 86%

“…Schematic of the experimental set-up. Both surface plasmon spectroscopy and microscopy are on the x-direction, and the photoelectron tunnelling technique is on the y-direction.For details see[29].…”

mentioning

confidence: 99%

Liquid⁴He on Cs: drying, depinning, and the non-wetting ‘thin-film’

Reinelt¹,

Iov²,

Leiderer³

et al. 2005

J. Phys.: Condens. Matter

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“…This light beam is reflected at the prism and the reflected light is measured with a very sensitive photodiode (for a more detailed description of such a setup see Ref. 6). Under resonance conditions, i.e., when the angle of incidence corresponds to the surface plasmon resonance angle, little or no light is detected.…”

Section: Experimental Verificationmentioning

confidence: 99%

Equilibrium helium film in the thick-film limit

Klier

Schletterer

Leiderer

et al. 2003

Low Temperature Physics

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For the thickness of a liquid or solid quantum film, like liquid helium or solid hydrogen, there exist still open questions about how the film thickness develops in certain limits. One of these is the thick film limit, i.e., the crossover from the thick film to bulk. We have performed measurements in this range using the surface plasmon resonance technique and an evaporated Ag film deposited on glass as substrate. The thickness of the adsorbed helium film is varied by changing the distance h of the bulk reservoir to the surface of the substrate. In the limiting case, when h ® 0, the film thickness approaches about 100 nm following the van der Waals law in the retarded regime. The film thickness and its dependence on h is precisely determined and theoretically modeled. The equilibrium film thickness behaviour is discussed in detail. The agreement between theory and experiment is very good.

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