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“…Complex microwave (MW) surface impedance of HTS films, which is measured experimentally, depends on the characteristics of charge carriers and the dynamics of magnetic flux lines [1][2][3][4][5][6][7][8][9] and can provide valuable information about the parameters of HTS materials. Successes in technology and science of HTS materials in the last decade have renewed the interest to magnetic oxides as well.…”
Section: Introductionmentioning
confidence: 99%
“…Complex microwave (MW) surface impedance of HTS films, which is measured experimentally, depends on the characteristics of charge carriers and the dynamics of magnetic flux lines [1][2][3][4][5][6][7][8][9] and can provide valuable information about the parameters of HTS materials. Successes in technology and science of HTS materials in the last decade have renewed the interest to magnetic oxides as well.…”
Section: Introductionmentioning
confidence: 99%
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