2022 IEEE Asian Solid-State Circuits Conference (A-Sscc) 2022
DOI: 10.1109/a-sscc56115.2022.9980646
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A 10Gb/s/pin DQS and WCK Built-Out Tester for LPDDR5 DRAM Test

Chan-Ho Kye
1
,
Jihee Kim
2
,
Kyungmin Baek
3
et al.
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