Widely used in telecom, television, music players, and controllers, a digital-to-analog converter (DAC) is a device that converts a digital signal into an analog signal. As integrated circuits (ICs) technologies develop, the modulation process has shifted from analog circuits to digital circuits, and the signal has been converted from a digital signal field to an analog signal field. Generally, the design of digital circuits is simpler than that of analog circuits, so the transferring can decline the requirement and difficulty of the system design. How the final DAC performs on the printed circuit board (PCB) directly affects the system's specifications. Therefore, verifying the final parameters of the DAC becomes an important task for the whole test. The DAC chip static parameters DNLity (DNL) and integral nonlinearity (INL) require measuring all points to get the calculated results. It will cost a long time if reading and recording are done by humans. This paper presents a fast and effective method to measure the static parameters of the DAC chip. The test time depends on the measurement accuracy and data. In this paper, the chip independently developed by Beijing Smart-Chip Microelectronics Technology Co. is used as a test case for testing. The results show that the DAC testing method mentioned in this paper can greatly shorten the testing time compared with manual testing.