A 26 GHz GaN-MMIC with Integrated Switches for Discrete Level Supply Modulation

Bengtsson, Olof; Paul, Shuva; Schulze, Christoph; Chevtchenko, Serguei; Heinrich, W.

doi:10.1109/ims19712.2021.9574904

2021 IEEE MTT-S International Microwave Symposium (IMS) 2021

DOI: 10.1109/ims19712.2021.9574904

|View full text |Cite

A 26 GHz GaN-MMIC with Integrated Switches for Discrete Level Supply Modulation

Olof Bengtsson

Shuva Paul

Christoph Schulze

et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

2024

Publication Types

Select...

Article1

Relationship

Self Cite1

Independent0

Authors

Journals

Cited by 1 publication

(1 citation statement)

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Considering the applications at millimeter-wave frequencies, such topologies are now being implemented as Microwave Monolithic Integrated Circuits (MMICs) with a requirement to measure the chip performance on-wafer, before dicing and placing the MMICs in multi-chip modules [3]- [5].…”

mentioning

confidence: 99%

A VNA-Based Wideband Measurement System for Large-Signal Characterization of Multiport Circuits

Schulze,

Mengozzi,

Gibiino

et al. 2024

IEEE Trans. Microwave Theory Techn.

Self Cite

View full text Add to dashboard Cite

This work reports on a wideband (WB) measurement system based on a vector network analyzer (VNA) topology for multi-port large-signal measurements. The setup exploits a modified commercial VNA with WB intermediate frequency (IF) outputs that allows for more than 5 GHz analysis bandwidth (BW), where the IF is captured using an external high-speed oscilloscope. A three-port configuration using six receivers is described, together with the signal processing to achieve the high dynamic range required for WB signal measurements. The calibration procedure to establish reference planes at the three ports of the device-under-test (DUT) are shown. A comparison is made between single-tone continuous-wave (CW) calibration and WB calibration using multi-tone signals, illustrating advantages, challenges and limitations. The system is then demonstrated for on-wafer WB characterization and linearization of a Dual Input Doherty Power Amplifier (DIDPA) using a 100-MHz instantaneous BW excitation signal at millimeter-wave frequencies. By leveraging on the error-corrected WB waves, an algorithm is proposed for modulated input signal control across a 600-MHz acquisition BW at the DUT on-wafer reference planes. The algorithm enables a user-defined emulated splitting of the input WB signals. The linearization performance of such an emulated PA configuration is finally evaluated.Index Terms-Digital predistortion (DPD), doherty power amplifier (DPA), millimeter-wave measurements, vector network analyzer (VNA), wideband measurements. I. INTRODUCTIONM ODERN applications of wireless telecommunications, as well as radar, exploit modulated signals at millimeter-wave frequencies with increasingly wider bandwidths (BWs), in the range of hundreds of MHz and beyond. Components and subsystems are therefore required to operate across large instantaneous BWs, so that instrumentation and characterization features need to be adapted to this demanding scenario. Nonlinear devices, such as radio-frequency (RF) power amplifiers (PAs), require network analysis to extract figures-of-merit (FoMs) like input and output match, available power gain, load-pull contours, etc. At the same time, they also require signal analysis FoMs like the error vector magnitude (EVM) [1]. As an additional complication, modern PA topologies addressing the ever-demanding trade-off between broadband linearity and power efficiency often result This work was partly funded by the German Federal Ministry of Education and Research (BMBF) under the project reference 16FMD02 (Forschungsfabrik Mikroelektronik Deutschland). C. Schulze, W. Heinrich and O. Bengtsson are with Ferdinand-Braun-Institut, Leibniz-Institut fuer Hoechstfrequenztechnik, Gustav-Kirchhoff-Str.

show abstract

mentioning

confidence: 99%

A VNA-Based Wideband Measurement System for Large-Signal Characterization of Multiport Circuits

Schulze,

Mengozzi,

Gibiino

et al. 2024

IEEE Trans. Microwave Theory Techn.

Self Cite

View full text Add to dashboard Cite

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

A 26 GHz GaN-MMIC with Integrated Switches for Discrete Level Supply Modulation

Cited by 1 publication

References 7 publications

A VNA-Based Wideband Measurement System for Large-Signal Characterization of Multiport Circuits

A VNA-Based Wideband Measurement System for Large-Signal Characterization of Multiport Circuits

Contact Info

Product

Resources

About