RADIOENGINEERING
 2017
DOI: 10.13164/re.2017.0772
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A 28-nm 32Kb SRAM For Low-VMIN Applications Using Write and Read Assist Techniques

Satyendra Kumar1,
Kaushik Saha2,
Harsh Gupta3

Abstract: Abstract. In this paper new write and read assist techniques, reduced coupling signal negative bitline (RCS-NBL

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