2018 IEEE Symposium on VLSI Circuits 2018
DOI: 10.1109/vlsic.2018.8502431
|View full text |Cite
|
Sign up to set email alerts
|

A 28NM Integrated True Random Number Generator Harvesting Entropy from MRAM

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
20
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
6
3

Relationship

0
9

Authors

Journals

citations
Cited by 46 publications
(21 citation statements)
references
References 1 publication
1
20
0
Order By: Relevance
“…The weaknesses of the thermal noise-based designs are its sensitivity to noise-based attacks, compromising the randomness of the output, as well as issues with the design complexity required for post-processing and tuning of the system 10,[23][24][25][26] . Many other entropy sources have been used for TRNGs, such as the timing of time dependent dielectric breakdown (TDDB) 27 , Photonics [28][29][30][31] , and current variation or switching time of emerging technologies such as ReRAM [32][33][34] . TDDB-based designs suffer from high complexity of circuit design and processing circuits which limit their use in low-area, low-power applications.…”
mentioning
confidence: 99%
“…The weaknesses of the thermal noise-based designs are its sensitivity to noise-based attacks, compromising the randomness of the output, as well as issues with the design complexity required for post-processing and tuning of the system 10,[23][24][25][26] . Many other entropy sources have been used for TRNGs, such as the timing of time dependent dielectric breakdown (TDDB) 27 , Photonics [28][29][30][31] , and current variation or switching time of emerging technologies such as ReRAM [32][33][34] . TDDB-based designs suffer from high complexity of circuit design and processing circuits which limit their use in low-area, low-power applications.…”
mentioning
confidence: 99%
“…The physical nature of this method needs either peripheral circuits or a sophisticated anti-bias design, both of which are relatively expensive and complex to manufacture. Hence, Yang et al proposed another TRNG design based on the fact that MTJ switching time itself can be a practical entropy source, and the proposal was verified with a commercial MRAM die [42].…”
Section: Switching-time Dependent Stochasticitymentioning
confidence: 99%
“…Up till now, four main types of strategies have been proposed to realize MTJ-TRNGs with sufficient randomness, fast speed, low energy, and compact area. As described in the last section, the TRNG performances in most of these spintronic devices are tested under simulation except [31,42] where the circuitboard of the MRAM die was used for verification. Bearing this fact in mind, the comparison of the best performances of each strategy is summarized in Table 1.…”
Section: Comparison and Perspectivementioning
confidence: 99%
“…Another way to produce random numbers is by using the random switching behavior of Magnetic Tunnel Junctions under low write current [22].…”
Section: ) Mrammentioning
confidence: 99%